2019
DOI: 10.1049/hve.2019.0077
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1 H NMR tests on damaged and undamaged XLPE and SiR samples

Abstract: Cross-linked polyethylene (XLPE) and silicone rubber (SiR) samples were subjected to a high-voltage AC stress plane-plane configuration and inclined plane test, respectively. The voltage was applied such that discharge was observed across the surface of the XLPE test sample for several hours and for visible damage to occur on SiR samples also after several hours. Selected stressed samples together with virgin samples from the same manufactured batch were tested using nuclear magnetic resonance (NMR) spectrosco… Show more

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Cited by 2 publications
(3 citation statements)
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“…Under the same voltage conditions, the value of t c is mainly a function of the microstructural changes of the XLPE dielectric under electrical stress. The free volume, represented by channels and voids, contributes to the dielectric electrical aging [22,23], which can affect the value of t c . As shown in Figure 15, when the externally applied electric field strength is E > E a , the conditions for the formation of the streamer discharge are reached in the free volume [24].…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…Under the same voltage conditions, the value of t c is mainly a function of the microstructural changes of the XLPE dielectric under electrical stress. The free volume, represented by channels and voids, contributes to the dielectric electrical aging [22,23], which can affect the value of t c . As shown in Figure 15, when the externally applied electric field strength is E > E a , the conditions for the formation of the streamer discharge are reached in the free volume [24].…”
Section: Discussionmentioning
confidence: 99%
“…Under the same voltage conditions, the value of t c is mainly a function of the microstructural changes of the XLPE dielectric under electrical stress. The free volume, represented by channels and voids, contributes to the dielectric electrical aging [22, 23], which can affect the value of t c .…”
Section: Discussionmentioning
confidence: 99%
“…The breakdown between the interface of the cross-linked polyethylene (XLPE) cable insulation and the accessory SiR insulation is the main cause of cable accessory failure [7][8][9]. The interface pressure, surface roughness, interface fillers, and space charge have been shown to be the main factors affecting the breakdown strength of insulating interfaces [10][11][12][13].…”
Section: Introductionmentioning
confidence: 99%