2022
DOI: 10.1002/adem.202201508
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Super‐Wideband Electromagnetic Absorbing TiC/SiOC Ceramic/Glass Composites Derived from Polysiloxane and Titanium Isopropoxide with Low Thickness (<1 mm)

Abstract: Herein, TiC/SiOC ceramic/glass composites with excellent electromagnetic wave (EMW) absorbing performance are fabricated by pyrolysis of polycarbosiloxane and titanium (IV) isopropoxide (TTIP). By taking advantage of the polymer‐derived route, the phase compositions and microstructures are easily tuned. The composites are investigated by X‐ray diffraction (XRD) analysis, scanning electron microscope, and transmission electron microscopy/energy dispersive spectroscopy. Nanoscaled TiC is formed and uniformly dis… Show more

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Cited by 22 publications
(9 citation statements)
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“…The microwave absorption properties of material and film are completely different. However, in microwave absorption research the properties of "layered material" or "material with thickness d" are often referred to as the properties of material and it is concluded that the property of reflection loss RL, which is a property of device, can be used to identify the best absorption material [1][2][3][4][5]. Layered material should be classified as film which is a device composed of a portion of material with two parallel interfaces as shown in Fig A1 . These two interfaces introduce back-and-forth reflections within film, and result in beams 1 r and t in front of the film.…”
Section: Introductionmentioning
confidence: 99%
“…The microwave absorption properties of material and film are completely different. However, in microwave absorption research the properties of "layered material" or "material with thickness d" are often referred to as the properties of material and it is concluded that the property of reflection loss RL, which is a property of device, can be used to identify the best absorption material [1][2][3][4][5]. Layered material should be classified as film which is a device composed of a portion of material with two parallel interfaces as shown in Fig A1 . These two interfaces introduce back-and-forth reflections within film, and result in beams 1 r and t in front of the film.…”
Section: Introductionmentioning
confidence: 99%
“…It is believed in the current theory from the principle of impedance matching that the absorption of film originates from the attenuation power of material along the optical path in the film for the penetrated microwaves [1,2,16,17,23], but this is not true [7,14]. Since Z in and Z M are different parameters, it is possible that Z in = Z 0 while Z M ≠ Z 0 .…”
Section: Resultsmentioning
confidence: 99%
“…In the prevailing theory, microwave absorption in films has been traditionally ascribed to the principle of impedance matching, positing that it arises from the attenuation power of the material along the optical path for the penetrating microwaves [1,2,20,21,29]. However, this conventional perspective is found to be inaccurate [11,18], The discrepancy lies in the distinct parameters of Z in and Z M , with the potential for Z in to equal Z 0 while Z M ≠ Z 0 .…”
Section: Resultsmentioning
confidence: 99%
“…The structure-dependent EM response mechanisms as unveiled by artificial intelligence are believed to offer more opportunities for a precise prediction and optimization of EMW absorption performance" [1]. However, these challenges arise due to a common confusion between the terms "film" and "material" [1,3,5,7,[32][33][34][35]. Specifically, the misapplication of the film parameter reflection loss (RL) to the material domain has been a persistent issue [36,37].…”
Section: Introductionmentioning
confidence: 99%