We have investigated the crystal structure and superconducting properties of thin films of FeSe 0.5 Te 0.5 grown on eight different substrates. Superconductivity is not correlated with the lattice mismatch, but rather it is correlated with the degree of in-plane orientation and with the lattice parameter ratio c/a. The best superconducting properties are observed in films on MgO and LaAlO 3 (T c zero of 9.5 K). TEM observation shows that the presence or absence of the amorphous-like layer at the substrate surface plays a key role in determining the structural and superconducting properties of the grown films.* E-mail address: imai@maeda1.c.u-tokyo.ac.jpAfter the discovery of superconductivity in F-doped LaFeAsO, 1) numerous studies on iron-based superconductors have been carried out. One common iron-based superconductor is FeSe with a superconducting transition temperature T c of 8 K, 2) and the partial substitution of Te for Se raises T c to a maximum of 14 K.3)This material has the tetragonal PbO-type structure, which is the simplest structure of all the iron-based superconductors. Thus, FeSe and related materials are considered the most suitable systems to investigate how superconductivity correlates to the crystal structures.Many studies on the film growth of FeSe 1-x Te x have already been reported.
4-11)However, the question of what substrates are suitable for the growth of thin FeSe 1-x Te x films remains controversial. For example, Kumary et al. 6) reported that the T c value of the film on SrTiO 3 (STO) was higher than on LaAlO 3 (LAO). In contrast, Han et al.
7)reported an opposite result; the T c value on LAO was higher than that on STO. In addition, Bellingeri et al. thickness were fixed at 573 K and at approximately 50 nm, respectively. The crystal structure and the orientation of the films were characterized by a θ-2θ and a 4-circle X-ray diffraction (XRD) using Cu Kα radiation at room temperature. We also performed a transmission electron microscopy (TEM) observation. The electrical resistivity (ρ) was measured by a four-terminal method from 2 to 300 K. Figure 1 shows the XRD patterns of the eight films. Except for a few unidentified peaks, only the 00l reflections of a tetragonal PbO-type structure are observed, which shows that the out-of-plane alignment is excellent. It should be noted that the c-axis orientation is observed even in the film prepared on the (0001) plane in hexagonal Al 2 O 3 , as shown in Fig. 1 (h). This indicates that the FeSe 1-x Te x films intrinsically favor two-dimensional growth. The temperature dependence of ρ is summarized in Fig. 2. As can be easily seen, the eight films exhibit a variety of ρ(T)behavior. Except for the film on Al 2 O 3 , the ρ value of these films at T = 300 K is