1982
DOI: 10.1016/0304-3991(82)90193-0
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Superconducting lens design

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Cited by 56 publications
(10 citation statements)
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“…The first two non-trivial eigenvectors of the data set, which themselves are images (Van Heel, 1984, 1989, will reflect the symmetry properties of the structure as identical symmetric wave patterns which are 900 out of phase (like a sine and a cosine wave). The samples were imaged in the Suleika cryo-electron microscope (Lefranc et al, 1982;Henderson et al, 1990). These techniques are reference-free (Schatz and Van Heel, 1990) and produce unbiased averages of the noisy microscopical images of symmetric structures.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The first two non-trivial eigenvectors of the data set, which themselves are images (Van Heel, 1984, 1989, will reflect the symmetry properties of the structure as identical symmetric wave patterns which are 900 out of phase (like a sine and a cosine wave). The samples were imaged in the Suleika cryo-electron microscope (Lefranc et al, 1982;Henderson et al, 1990). These techniques are reference-free (Schatz and Van Heel, 1990) and produce unbiased averages of the noisy microscopical images of symmetric structures.…”
Section: Resultsmentioning
confidence: 99%
“…All electron images were recorded using a Suleika 4 K cryo-electron microscope (Lefranc et al, 1982;Henderson et al, 1990) to minimize radiation damage and stain crystallization during the exposure to electrons. All electron images were recorded using a Suleika 4 K cryo-electron microscope (Lefranc et al, 1982;Henderson et al, 1990) to minimize radiation damage and stain crystallization during the exposure to electrons.…”
Section: Methodsmentioning
confidence: 99%
“…Transmission electron microscopy was performed using a modi®ed Philips model CM20 FEG, within which the commercial objective lens had been replaced by a liquid helium-cooled superconducting objective lens (Zemlin et al, 1996;Lefranc et al, 1982). This electron microscope provides the combined advantages of coherent illumination of the ®eld emission gun and minimal radiation damage due to the $4 K specimen temperature.…”
Section: Electron Microscopymentioning
confidence: 99%
“…7~1 0~~ with C, = 1.35mm and A = 0.037 A. These are the parameters of the microscope used (Lefranc et al, 1982). For demonstration, in Figure 2a, a carbon foil imaged at 45" tilt is shown.…”
Section: The Fading Of the Phase-contrast Transfer Function (Pctf) Dumentioning
confidence: 99%