PACS 74.40.+k, 74.78.Na, 85.25.Oj We measured the temperature-and current-dependence of dark count rates of a superconducting singlephoton detector. The detector's key element is a 84 nm wide meander strip line fabricated from a 5 nm thick NbN film. Due to its reduced dimensions various types of fluctuations can cause temporal and localized transitions into a resistive state leading to dark count events. Adopting a recent refinement of the hotspot model we achieve a satisfying description of the experimental dark count rates taking into account fluctuations of the Cooper-pair density and current-assisted unbinding of vortex-antivortex pairs.1 Introduction As the size and dimensions of a physical system are reduced, it is a well-known general trend that fluctuations play an increasingly important role. With the ongoing progress in miniaturization of superconducting electronic devices, superconducting quantum interference devices [1], quantum computing [2] and quantum detectors [3] are mentioned as examples, fluctuations become more and more important for their overall performance. In order to be competitive in comparison to their semiconducting counterparts a very low noise level is paramount. In this paper we present measurements of the temperatureand current-dependence of dark count rates for a superconducting single-photon counter and discuss these results with respect to fluctuations of the Cooper-pair density and the current-assisted unbinding of vortexantivortex pairs related to the Berezinskii-Kosterlitz-Thouless (BKT) transition in thin superconducting films. A key element that allows us to include fluctuations in the superconducting order parameter is a recent refinement of the commonly used hot-spot model [4] to describe these detectors.