Single
crystals of YPd2Si2, which crystallizes
in the body-centered tetragonal ThCr2Si2-type
structure, were grown from PdSi-flux and characterized by means of
X-ray diffraction, low-temperature specific heat and electrical resistivity
measurements. The collected data revealed bulk type-II superconductivity
with the critical temperature T
c = 0.46
K as well as robust surface superconductivity with the critical field
about three times larger than the bulk one.