“…The wavelength-dependent complex refractive index of Si fitted with the experimental data [44] and that of the inner shell, the outer shell and the surrounding medium (air) are set to be 2.5, 1.5 and 1.0, respectively. Note here that for simplicity, we have neglected the wavelength dependence of the refractive indices to neatly determine the impact of their size on the absorption spectra [30,31,45], as discussed later; however, as long as the wavelength dependence is negligible, our results could apply to any other dielectric with similar refractive index, such as SiO 2 , Si 3 N 4 and so forth. The insets are the cross-sectional views of the NW only coated with the outer shell (OSNW) (left), DSNW (middle) and the NW only coated with the outer shell (ISNW) (right), where J ph is the photocurrent density; t 1 , t 2 , t = t 1 + t 2 = 180 nm, r = 100 nm and R = r + t = 280 nm are the outer shell thickness, the inner shell thickness, the total shell thickness, the core radius and the total radius; m 3 , m 2 , m 1 and m 0 are the complex refractive indices of the Si core, the inner shell, the outer shell and air, respectively.…”