2005 International Conference on Computer Design
DOI: 10.1109/iccd.2005.101
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Supply voltage degradation aware analytical placement

Abstract: In leading-edge chip designs, the dimensional variation that arises from lithography, etch, and planarization processes of multilevel metallization is significant due to its direct impact on wire parasitics and circuit timing. Modeling the dimensional variation helps reduce uncertainty in the extraction of parasitics and enables closure -not only of design, but of various process-design tradeoffs. Today, interconnect analyses and manufacturing are complicated by several close interactions among various compone… Show more

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Cited by 15 publications
(9 citation statements)
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“…The current upper bounds can guarantee the circuit operates correctly even under the worst-case scenarios. Consequently, the peak current modeling is widely used in the literature [39][40][41][42][43][44] for voltage drop optimization. Because we consider soft blocks which do not have the exact placement of the standard cells at the floorplanning stage, our current model uses the peak current function, which is based on worst-case scenarios and takes account of area, switching activity, and current density simultaneously, to determine the load current.…”
Section: Current Source Modelingmentioning
confidence: 99%
“…The current upper bounds can guarantee the circuit operates correctly even under the worst-case scenarios. Consequently, the peak current modeling is widely used in the literature [39][40][41][42][43][44] for voltage drop optimization. Because we consider soft blocks which do not have the exact placement of the standard cells at the floorplanning stage, our current model uses the peak current function, which is based on worst-case scenarios and takes account of area, switching activity, and current density simultaneously, to determine the load current.…”
Section: Current Source Modelingmentioning
confidence: 99%
“…In [5] we present a supply voltage degradation-aware analytical placement method which relocates cells to reduce supply voltage degradation. We represent supply voltage degradation at an observed power supply node as function of supply currents and effective resistances in a DC power network, and integrate supply voltage degradation into the APlace framework.…”
Section: Recent Applicationsmentioning
confidence: 99%
“…In other recent work, we have successfully applied the APlace framework to perform supply voltage degradationaware placement [5] and lens aberration-aware timing-driven placement [6]. We briefly describe each of these adaptations in this paper.…”
Section: Introductionmentioning
confidence: 98%
“…These hotspots should be resolved at the signoff stage to avoid timing degradation and functional failure. Placing cells to minimize static IR-drop has been proven to be NP-hard [4]. The dynamic IR-drop optimization problem is more complicated due to the time-variant property.…”
Section: Introductionmentioning
confidence: 99%