2023
DOI: 10.1002/smll.202207817
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Suppressed Voltage Deficit and Degradation of Perovskite Solar Cells by Regulating the Mineralization of Lead Iodide

Abstract: efforts devoted to defect passivation, interface engineering, and optical engineering, the power conversion efficiency (PCE) of mixed cation metal halide perovskite solar cells (PSCs) with n-i-p architecture has been boosted to over 25%. [7][8][9] For polycrystalline perovskite films, defects that induce nonradiative recombination and unbalanced carrier transport limit the PCE of PSCs. [10][11][12][13][14] Moreover, negative defects with low formation energy provide pathways for ion migration and channels for … Show more

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Cited by 15 publications
(8 citation statements)
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“…Tin oxide (SnO 2 ) is the most commonly used ETL in state-of-the-art PSCs due to its high electron mobility, high transmittance, high stability, great energy alignment, and low process temperature. [7][8][9] However, there are amounts of critical issues hidden in the interface between SnO 2 ETL and perovskite. For example, the defects distributed on the buried interface between perovskite and SnO 2 ETL can deteriorate PCE and the long-term stability of PSCs [10] such as oxygen vaccines, tin vacancies, and hydroxyl groups.…”
Section: Introductionmentioning
confidence: 99%
“…Tin oxide (SnO 2 ) is the most commonly used ETL in state-of-the-art PSCs due to its high electron mobility, high transmittance, high stability, great energy alignment, and low process temperature. [7][8][9] However, there are amounts of critical issues hidden in the interface between SnO 2 ETL and perovskite. For example, the defects distributed on the buried interface between perovskite and SnO 2 ETL can deteriorate PCE and the long-term stability of PSCs [10] such as oxygen vaccines, tin vacancies, and hydroxyl groups.…”
Section: Introductionmentioning
confidence: 99%
“…[10] It should be noted that the presence of non-radiative recombination sites in perovskite films and mismatched energy levels between the perovskite photoactive and transport layers act as obstacles for carrier collection and energy utilization, resulting in V oc loss. [11] However, the defects in perovskite films can produce trap-energy states within the band gap that trap charge carriers and promote the degradation of perovskite, [12] for example, by reacting with ambient moisture [13] or oxygen, [14] and facilitate ion migration. [15] In mixed-halide perovskites, defects are also associated with the commonly observed photo-stimulated halide phase segregation, which rapidly lowers the PCE under operating conditions.…”
Section: Introductionmentioning
confidence: 99%
“…These limiting factors can be mainly attributed to the open‐circuit voltage ( V oc ) loss and presence of crystallographic defects in perovskite films [10] . It should be noted that the presence of non‐radiative recombination sites in perovskite films and mismatched energy levels between the perovskite photoactive and transport layers act as obstacles for carrier collection and energy utilization, resulting in V oc loss [11] . However, the defects in perovskite films can produce trap‐energy states within the band gap that trap charge carriers and promote the degradation of perovskite, [12] for example, by reacting with ambient moisture [13] or oxygen, [14] and facilitate ion migration [15] .…”
Section: Introductionmentioning
confidence: 99%