2021
DOI: 10.3390/electronics10080942
|View full text |Cite
|
Sign up to set email alerts
|

Suppressing Buffer-Induced Current Collapse in GaN HEMTs with a Source-Connected p-GaN (SCPG): A Simulation Study

Abstract: Carbon doping in the buffer of AlGaN/GaN high-electron-mobility transistors (HEMTs) leads to the notorious current collapse phenomenon. In this paper, an HEMT structure with a source-connected p-GaN (SCPG) embedded in the carbon-doped semi-insulating buffer is proposed to suppress the buffer-induced current collapse effect. Two-dimensional transient simulation was carried out to show the successful suppression of buffer-induced current collapse in the SCPG-HEMTs compared with conventional HEMTs. The mechanism … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2022
2022
2024
2024

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
(1 citation statement)
references
References 37 publications
0
1
0
Order By: Relevance
“…The phenomenon is also being extensively measured on various structures too [13,14]. There are also current-collapse-free GaN transistors under development [15][16][17]. However, presently available GaN devices still exhibit the deteriorated behavior caused by the increased on-state resistance.…”
Section: Introductionmentioning
confidence: 99%
“…The phenomenon is also being extensively measured on various structures too [13,14]. There are also current-collapse-free GaN transistors under development [15][16][17]. However, presently available GaN devices still exhibit the deteriorated behavior caused by the increased on-state resistance.…”
Section: Introductionmentioning
confidence: 99%