Suppression of Surface Roughening during Ion Bombardment of Semiconductors

Abstract

Ion beams are used routinely for processing of semiconductors, particularly sputtering, ion implantation, and direct-write fabrication of nanostructures. However, the utility of ion beam techniques is limited by crystal damage and surface roughening. Damage can be reduced or eliminated by performing irradiation at elevated temperatures. However, under these conditions, surface roughening is highly problematic due to thermal mobility of adatoms and surface vacancies. Here, we solve this problem using hydrogen gas, which we use to stabilize surface mass flow and suppress roughening during ion bombardment of elemental and compound semiconductors. We achieve smooth surfaces during ion beam processing and show that the method can be enhanced by radicalizing H2 gas using a remote plasma source. Our approach is broadly applicable and expands the utility of ion beam techniques for the processing and fabrication of functional materials and nanostructures.