2016
DOI: 10.1016/j.apsusc.2015.12.162
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Surface analysis characterisation of gum binders used in modern watercolour paints

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Cited by 11 publications
(3 citation statements)
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“…Enzyme-linked immunosorbent assay has also shown great potential in distinguishing gum arabic and tragacanth from proteinaceous binders in art samples 36 37 . More recently, combination of scanning-electron microscopy with energy-dispersive X-ray spectroscopy and X-ray photoelectron spectroscopy was used to study the surface of watercolors paints and the identification of gum arabic was suggested 38 .…”
mentioning
confidence: 99%
“…Enzyme-linked immunosorbent assay has also shown great potential in distinguishing gum arabic and tragacanth from proteinaceous binders in art samples 36 37 . More recently, combination of scanning-electron microscopy with energy-dispersive X-ray spectroscopy and X-ray photoelectron spectroscopy was used to study the surface of watercolors paints and the identification of gum arabic was suggested 38 .…”
mentioning
confidence: 99%
“…GA has been also used in the textile industry to improve the mechanical properties of fibers, and in pharmaceuticals to coat pills [95]. Because of the interesting binding properties, GA is also used in lithography [96], printing [97], and paints [98]. More recently, GA has been investigated as a surfactant for nanoparticles [99], nanocomposites [93], and sensors [100].…”
Section: Gum Arabicmentioning
confidence: 99%
“…Argon cluster-ion sources were originally developed for semiconductor processing, [1][2][3] and advanced coatings, 4 surface modification and cleaning, 3,5 and the use of these sources for analytical applications was pioneered in SIMS. 6,7 They are equally useful in XPS, 8,9 where for example sputter depth profiling of organic materials, 10 such as semiconductors 11 can give access to defect and band bending measurements at interfaces, heritage materials can be analysed after removal of organic films, 12 and many applications can be found in the field of inorganic analysis. 13,14 There is still an absence of sputter yield reference data, made worse by the fact that unlike monatomic sputter profiling, cluster ions used in XPS or SIMS are typically in a regime where the energy of each atom in the cluster is close to the monatomic sputter threshold, 15 making sputter yield rather more complex.…”
Section: Introductionmentioning
confidence: 99%