1996
DOI: 10.1021/a19600146
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Surface Analysis:  X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy

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Cited by 26 publications
(14 citation statements)
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“…• H and He not detectable 129 • Damage and decomposition of soft and metastable materials 131 • Preferential sputtering during depth-profiling can remove more volatile components and change composition 30 • Beam-induced changes in oxidation state 129 • Binding energy shift due to charge accumulation, as well as junction and surface photovoltage 129,132 • Gas-phase surface contaminants can occur 129 Auger electron spectroscopy (AES) Sample irradiated with 3-20 keV electrons, ejecting core-level electrons in atoms and creating vacancies. Relaxation of outer electron to vacancy results in emission of Auger electron.…”
Section: Page 10 Of 39 Acs Paragon Plus Environment Chemistry Of Matementioning
confidence: 99%
“…• H and He not detectable 129 • Damage and decomposition of soft and metastable materials 131 • Preferential sputtering during depth-profiling can remove more volatile components and change composition 30 • Beam-induced changes in oxidation state 129 • Binding energy shift due to charge accumulation, as well as junction and surface photovoltage 129,132 • Gas-phase surface contaminants can occur 129 Auger electron spectroscopy (AES) Sample irradiated with 3-20 keV electrons, ejecting core-level electrons in atoms and creating vacancies. Relaxation of outer electron to vacancy results in emission of Auger electron.…”
Section: Page 10 Of 39 Acs Paragon Plus Environment Chemistry Of Matementioning
confidence: 99%
“…X-ray photoelectron spectroscopy (XPS) allows to study the materials surface, permitting to know the chemical composition and to establish the involved bonds [218][219][220]. It consists in the …”
Section: X-ray Photoelectron Spectroscopy (Xps)mentioning
confidence: 99%
“…X-ray photoelectron spectroscopy (XPS) allows to study the materials surface, permitting to know the chemical composition and to establish the involved bonds [218][219][220]. It consists in the irradiation of a sample with a monochromatic x-ray source: photons enter the material and undergo various interactions, leading to the photoelectric effect and the Auger emission.…”
Section: X-ray Photoelectron Spectroscopy (Xps)mentioning
confidence: 99%
“…X-ray photoelectron spectroscopy (XPS) is an effective and reliable analytical method for elemental identification and quantification of the chemical states of active surface atoms because it is surface sensitive and non-destructive [9]. Most XPS studies of magnetite were focused on the determination of the Fe 2+ /Fe 3+ ratio [10,11] and the effects on the adsorption, reduction, or removal of heavy metals [12][13][14].…”
Section: Introductionmentioning
confidence: 99%
“…The photoelectron spectrum of transition metal oxides is typically complicated due to peak asymmetries, complex multiplet splitting, shake-up and plasmon loss structures, and uncertain, overlapping energies [9,15]. For example, the Fe 2p region (700-740 eV) overlaps with the Auger peak of Co (713 eV); similarly, the Auger peak of Fe (784 eV) appears within the Co 2p region (770-815 eV) [16].…”
Section: Introductionmentioning
confidence: 99%