2022
DOI: 10.1021/acsami.2c19201
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Surface Capping Layer Prepared from the Bulky Tetradodecylammonium Bromide as an Efficient Perovskite Passivation Layer for High-Performance Perovskite Solar Cells

Abstract: The power conversion efficiency (PCE) of perovskite solar cells (PSCs) has increased and levels with silicon solar cells; however, their commercialization has not yet been realized because of their poor long-term stability. One of the primary causes of the instability of PSC devices is the large concentration of defects in the polycrystalline perovskite film. Such defects limit the device performance besides triggering hysteresis and device instability. In this study, tetradodecylammonium bromide (TDDAB) was u… Show more

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Cited by 8 publications
(13 citation statements)
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“…As shown in Figure S9d, the water contact angles of the control perovskite film, CDT‐S and CDT‐N treated perovskite films are 56.3°, 76.6°, and 72.2°, respectively. Apparently, the organic semiconductors CDT‐S and CDT‐N increase the water contact angle of perovskite films, which is of significance for the stability of perovskites [51,52] …”
Section: Resultsmentioning
confidence: 99%
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“…As shown in Figure S9d, the water contact angles of the control perovskite film, CDT‐S and CDT‐N treated perovskite films are 56.3°, 76.6°, and 72.2°, respectively. Apparently, the organic semiconductors CDT‐S and CDT‐N increase the water contact angle of perovskite films, which is of significance for the stability of perovskites [51,52] …”
Section: Resultsmentioning
confidence: 99%
“…Apparently, the organic semiconductors CDT-S and CDT-N increase the water contact angle of perovskite films, which is of significance for the stability of perovskites. [51,52] In this regard, the long-term stability of the device were further studied. As shown in Figure 8a, after stored in 1000 hours in ambient condition with a relative humidity of 30 % and a temperature of 25 °C, the efficiency of the control and CDT-S-treated unencapsulated devices retained 58 % and 90.5 % of the initial values, respectively.…”
Section: According To the Above Discussion The Cdt-s-and Cdt-ntreatme...mentioning
confidence: 99%
“…The device fabrication procedures and fitting equations were adopted from the literature. [26] The trap density was calculated using Equation (3).…”
Section: Resultsmentioning
confidence: 99%
“…The device fabrication procedures and fitting equations were adopted from the literature. [ 26 ] The trap density was calculated using Equation (). Ntrapsbadbreak=2εε0VTFLeL2$$\begin{equation}{N}_{{\mathrm{traps}}} = \frac{{2\varepsilon {\varepsilon }_0{V}_{{\mathrm{TFL}}}}}{{e{L}^2}}\end{equation}$$where N traps is the trap density, ɛ is the relative dielectric constant of CsPbI 3 , [ 31 ] ɛ 0 is vacuum permittivity, V TFL is trap‐filled limit voltage, e is the elementary charge, and L is the thickness of perovskite films.…”
Section: Resultsmentioning
confidence: 99%
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