1997
DOI: 10.1021/a1970009h
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Surface Characterization

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Cited by 12 publications
(8 citation statements)
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“…14,15 Form I, II, and V were sufficiently stable and available in sufficient quantity to allow study by FTIR spectroscopy (Table 2). The main region of difference among the forms is from 1600 to 1200 cm −1 (Fig.…”
Section: Resultsmentioning
confidence: 99%
“…14,15 Form I, II, and V were sufficiently stable and available in sufficient quantity to allow study by FTIR spectroscopy (Table 2). The main region of difference among the forms is from 1600 to 1200 cm −1 (Fig.…”
Section: Resultsmentioning
confidence: 99%
“…One widely used non-destructive surface analysis technique is X-ray photoelectron spectroscopy (XPS). In this technique, particular electron binding energies of elements located at the surface are used to quantify the elemental composition and identify the chemical states of surface elements [153][154][155]. This spectroscopic method can identify all elements on the surface of activated carbon.…”
Section: X-ray Photoelectron Spectroscopy (Xps)mentioning
confidence: 99%
“…Since the aforementioned reactions generally occur in the region of the solid/aqueous interface, numerous studies have been performed in the relevant aspects, e.g., mechanistic interpretation, model refinement and simulation strategy (Katz and Hayes, 1995;Hiemstra and Van Riemsdijk, 1996;Borkovec, 1997;Lu¨tzenkirchen, 1998). The corresponding techniques for identifying the reaction products have been greatly developed as well (McGuire et al, 1999).…”
Section: Introductionmentioning
confidence: 99%