1995
DOI: 10.1002/sia.740230206
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Surface characterization of SiC mirrors exposed to fast atomic oxygen

Abstract: Two chemical vapor deposited silicon carbide (SIC) mirrors were exposed to the 5 eV fast atomic oxygen environment in low Earth orbit on NASA's Long Duration Exposure Facility (LDEF) which remained in space for nearly 6 years. The samples were characterized using the techniques of x-ray photoelectron spectroscopy (XPS), ellip sometry, and reflectance measurements. The normal-incidence optical reflectance of the atomic-oxygenexposed portion of one sample degraded considerably over the 60-160 am span. The XPS re… Show more

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Cited by 16 publications
(4 citation statements)
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“…Degradation was attributed to surface oxidation to SiO2. The effect of AO on CVD-SiC EUV-FUV reflectance and the synergic effect of AO along with UV radiation on the CVD-SiC near-UV reflectance were reported by G. Raikar et al [51] and S. Mileti et al [52], respectively. The loss in performance does not exclude the use of CVD-SiC for missions where oxygen in not present.…”
Section: Atomic Oxygenmentioning
confidence: 75%
“…Degradation was attributed to surface oxidation to SiO2. The effect of AO on CVD-SiC EUV-FUV reflectance and the synergic effect of AO along with UV radiation on the CVD-SiC near-UV reflectance were reported by G. Raikar et al [51] and S. Mileti et al [52], respectively. The loss in performance does not exclude the use of CVD-SiC for missions where oxygen in not present.…”
Section: Atomic Oxygenmentioning
confidence: 75%
“…Degradation was attributed to surface oxidation to SiO 2 . The effect of AO on the CVD-SiC EUV-FUV reflectance and the synergic effect of AO along with UV radiation on the CVD-SiC near-UV reflectance were reported by G. Raikar et al [51] and S. Mileti et al [52], respectively. The loss in performance does not exclude the use of CVD-SiC for missions where oxygen is not present.…”
Section: Atomic Oxygenmentioning
confidence: 76%
“…From the XPS studies, the thickness (x) of the layer of surface components can be estimated according to the relative intensities ratio algorithm 3,8,10,12,17 …”
Section: Resultsmentioning
confidence: 99%
“…The growth of a silica layer at the surface was observed after thermal oxidation in oxygen, 6,7,8,10,12,13 ozone 8 and air. 8,9,11 The existence of some intermediate species such as SiO x C y at the interface between SiC and SiO 2 layers 7,11,13 14 showed that SiO x C y assumes an SiC-like structure when x < y and an SiO 2 -like structure when x > y.…”
Section: Introductionmentioning
confidence: 96%