2020
DOI: 10.1021/acs.langmuir.9b03467
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Surface-Controlled Crystal Alignment of Naphthyl End-Capped Oligothiophene on Graphene: Thin-Film Growth Studied by in Situ X-ray Diffraction

Abstract: We report on the microstructure, morphology, and growth of 5,5´-bis(naphth-2yl)-2,2´-bithiophene (NaT2) thin films deposited on graphene, characterized by grazingincidence X-ray diffraction (GIXRD) and complemented by atomic force microscopy (AFM) measurements. NaT2 is deposited on two types of graphene surfaces: custom-made samples where CVD-grown graphene layers are transferred onto a Si/SiO 2 substrate by us and common commercially transferred CVD graphene on Si/SiO 2 . Pristine Si/SiO 2 substrates are used… Show more

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Cited by 11 publications
(23 citation statements)
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“…The confirmation of crystal orientation in bulk or thin-films was performed by X-ray diffraction, 3,[7][8][9][10][11][12][13][14][15][16] low-energy electron diffraction (LEED), [17][18][19] photoemission electron microscopy, 20 optical measurements, 2,[14][15][16][21][22][23][24][25][26][27][28][29][30][31][32][33][34][35][36][37][38] and atomic force microscopy (AFM). 2,30,[39][40][41][42][43] For small molecule organic materials that are soluble in organic solvents, X-ray diffraction measurement and absorption spectroscopy 2,15,16,21,22 have been used to investigat...…”
Section: Introductionmentioning
confidence: 99%
“…The confirmation of crystal orientation in bulk or thin-films was performed by X-ray diffraction, 3,[7][8][9][10][11][12][13][14][15][16] low-energy electron diffraction (LEED), [17][18][19] photoemission electron microscopy, 20 optical measurements, 2,[14][15][16][21][22][23][24][25][26][27][28][29][30][31][32][33][34][35][36][37][38] and atomic force microscopy (AFM). 2,30,[39][40][41][42][43] For small molecule organic materials that are soluble in organic solvents, X-ray diffraction measurement and absorption spectroscopy 2,15,16,21,22 have been used to investigat...…”
Section: Introductionmentioning
confidence: 99%
“…5c and Supplementary Table 2 29 . Illuminating the sample under conditions where the incident angle is above the critical angle allow the penetration of the full thin film and so yield information over the full thickness [30][31][32][33] . The beamline setup includes the UV-LED, a Vis spectroscopy setup to confirm changes in thickness of the thin film during light exposure as well as a camera to observe any macroscopic change.…”
Section: Methodsmentioning
confidence: 99%
“…and it has been proposed that PMMA residues influence the molecular orientation, when NaT2 molecules are deposited on top [29]. Finally, a thin film of preheated (230 °C) NaT2 was deposited onto the heated, graphene-covered substrates by physical vapor deposition (PVD).…”
Section: Sample Preparationmentioning
confidence: 99%
“…Huss-hansen et al used grazing incidence X-ray diffraction (GIXRD) to study an OSC thin film consisting of 5,50-bis(naphth-2-yl)-2,20-bithiophene (NaT2) deposited on substrates of pristine SiO 2 and substrates of SiO 2 covered with high-quality graphene [29]. NaT2 is a rod-shaped, naphthyl end-capped oligothiophene forming upright standing molecular structures when deposited on SiO 2 , and additionally forming face-on structures when deposited on graphene (Fig.…”
Section: Introductionmentioning
confidence: 99%
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