2019
DOI: 10.1109/access.2019.2898215
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Surface Defect Classification for Hot-Rolled Steel Strips by Selectively Dominant Local Binary Patterns

Abstract: Developments in defect descriptors and computer vision-based algorithms for automatic optical inspection (AOI) allows for further development in image-based measurements. Defect classification is a vital part of an optical-imaging-based surface quality measuring instrument. The high-speed production rhythm of hot continuous rolling requires an ultra-rapid response to every component as well as algorithms in AOI instrument. In this paper, a simple, fast, yet robust texture descriptor, namely selectively dominan… Show more

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Cited by 60 publications
(44 citation statements)
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“…It cannot be ignored that the useful description information in the non-uniform patterns in all these LBP variants has been elided. Luo et al creatively used the reverse thinking to explore the non-uniform pattern to supplement the description information hidden in the uniform pattern in [ 7 ] and [ 61 ]. As lightweight feature descriptors, LBP and its variants can be applied to defect detection and classification at the same time, and researchers should follow and develop LBP variants or LBP-like descriptors with better noise robustness and scale invariance, which is also in line with the future development trend of AVI.…”
Section: Taxonomy Of Two-dimension Defect Detection Methodsmentioning
confidence: 99%
“…It cannot be ignored that the useful description information in the non-uniform patterns in all these LBP variants has been elided. Luo et al creatively used the reverse thinking to explore the non-uniform pattern to supplement the description information hidden in the uniform pattern in [ 7 ] and [ 61 ]. As lightweight feature descriptors, LBP and its variants can be applied to defect detection and classification at the same time, and researchers should follow and develop LBP variants or LBP-like descriptors with better noise robustness and scale invariance, which is also in line with the future development trend of AVI.…”
Section: Taxonomy Of Two-dimension Defect Detection Methodsmentioning
confidence: 99%
“…Using reverse thinking, Luo et al [3] proposed a generalized completed local binary patterns (GCLBP) by first exploring the non-uniform patterns to supplement the descriptive information in uniform patterns. Further the work of GCLBP, Luo et al developed a more effective LBP-descriptor (namely SDLBP) in [46], which has remarkable advantages in anti-interference and simplicity of calculation. As a lightweight feature descriptor, LBP variants can be applied on both defect detection and classification, developing more noise-robust and scale-invariant LBP variants or LBP-like descriptors is highly encouraged and coincides with the AVI future trends.…”
Section: ) Local Binary Patternmentioning
confidence: 99%
“…A homomorphic mapping is given by the lattice of FDFA in the homomorphic mapping layer. At the same time, a fuzzy inference algorithm by FA is given in the fuzzy inference layer, as well as the inference operator is also novel, because it adopts the fuzzy operator method instead of the usual detection operator method [12]- [17]. Compare it with the old method in the simulation.…”
Section: Construction Of Energy Saving Detection Model By Fdfa Lmentioning
confidence: 99%
“…At present, there are some disadvantage in the existing literatures [12]- [17], [25]- [33] on the detection methods for battery power, because these methods only detected the state of charge, but couldn't achieve automatic charging or add electrolyte to the battery automatically.…”
Section: Applications Of Detection Model By Fdfamentioning
confidence: 99%
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