Surface defect detection of industrial components based on vision

Abstract

Early and effective surface defect detection in industrial components can avoid the occurrence of serious safety hazards. Since most industrial component surfaces have tiny defects with high similarity to the detection background, there are often issues of missed or false detections when defects are detected, leading to low detection accuracy. To deal with the aforementioned issue, this essay suggests a high-precision detection model for surface defects in industrial components based on the YOLOv5 algorithm. First, the original spatial pyramid pooling (SPPF) is innovated by proposing the SPPFKCSPC module, which improves the network's capacity for feature extraction from targets at different scales and fuses multiscale features better. Then, C3 is combined with SPPFKCSPC and replaces the C3 module of the backbone network, which improves feature expression and enhances the receptive field of the network. Finally, the coordinate attention mechanism (CA) has been embedded into the YOLOv5 neck network, and the bounding box regression loss function of the algorithm is improved to EIOU, not only improving the precision of the target localization and recognition model but also enhancing the overall network performance. Based on the public datasets NEU-DET and PV-Multi-Defect, multiple sets of experiments were conducted using innovative algorithms. On the NEU-DET dataset, we got a mean average accuracy (mAP) of 88.3%, which is 7.2% greater than the original approach. On the PV-Multi-Defect dataset, the mAP value reached 97.5%, an improvement of 1.5%. As shown by the experimental data, the detection results significantly improved.

DG2GAN: improving defect recognition performance with generated defect image sample

“…Traditional methods for defect identification include manual visual inspection and image processing-based approaches. Manual inspection is susceptible to subjective judgments by inspectors, which may lead to inconsistent and inaccurate results due to factors such as fatigue, experience, emotions, among others 12 . Additionally, traditional image processing methods, such as histogram statistics, Grey-Level Co-occurrence Matrix (GLCM), and Fourier features, necessitate manual design and selection of features, which is laborious, lacks reusability, and is challenging to adapt to diverse and complex defect scenarios.…”