“…Many established UHV-based surface science techniques have successfully contributed to an increasingly detailed understanding not only of the IL/ vacuum interface, but also of IL bulk properties. The applied methods include X-ray photoelectron spectroscopy (XPS) [106,107,, UV photoelectron spectroscopy [138,139,165,166], inverse photoelectron spectroscopy (IPES) [165,166], X-ray absorption spectroscopy (NEXAFS) [165], soft X-ray emission spectroscopy (SXES) [166], low energy ion scattering (LEIS) [141], metastable ion spectroscopy (MIES) [138,139], time-offlight secondary mass spectroscopy (TOF-SIMS) [140], Rutherford backscattering [167][168][169][170][171], high resolution electron energy loss spectroscopy (HREELS) [138], reflection absorption infrared spectroscopy (RAIRS) [172][173][174][175], direct recoil spectroscopy (DRS) [176], and scanning tunneling microscopy [177][178][179][180][181], to name only a few. In addition, an increasing number of theoretical studies and simulations have been conducted [101,[182][183][184][185][186][187][188][189][190].…”