2007
DOI: 10.1007/s10853-007-1580-3
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Surface functionalization of silk fabric by PTFE sputter coating

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Cited by 44 publications
(26 citation statements)
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“…As reported in the literature, the contact angle of PTFElike films, deposited by RF Sputtering, depends on Ar ionbeam energy [40,41]. Basically, when large moieties of CF 2 and CF 3 groups are generated, the surface energy is reduced and thus the contact angle increases.…”
Section: Refractive Index Measurementmentioning
confidence: 87%
See 1 more Smart Citation
“…As reported in the literature, the contact angle of PTFElike films, deposited by RF Sputtering, depends on Ar ionbeam energy [40,41]. Basically, when large moieties of CF 2 and CF 3 groups are generated, the surface energy is reduced and thus the contact angle increases.…”
Section: Refractive Index Measurementmentioning
confidence: 87%
“…Previous reports are present in the literature on the properties of PTFE-sputtered films [39][40][41]. Particularly regarding chemical composition, wettability, and morphology, RF-sputtered PTFE coatings were grown under several bias voltages and gas compositions on silicon wafers [42,43].…”
Section: Introductionmentioning
confidence: 99%
“…The contact angle of the PTFE coated fabric showed an increase from 68° to about 138°. The larger sputtering pressures brought less contact angle hysteresis [25]. The different films exhibited contact angles from 119° up to 153°, depending on the preparation conditions.…”
Section: Pfp Coatings On Fabricsmentioning
confidence: 98%
“…The untreated and treated waste silk demonstrated rough bands in the region 1660-1630 cm −1 , which were attributed to the stretching vibration of amide I. Other characteristics peaks found at 1545-1525 cm -1 are the amide II and 1265-1235 cm −1 is the amide III [33,34]. The FT-IR spectra of sample wSF-PDA and wSF-PDA/Fe showed a characteristic bending at 570 cm −1 [35,36], indicating the formation of Fe-O due to the presence of PDA [30] and subsequent loading of iron particles.…”
Section: Fourier Transform Infrared (Ft-ir) Analysismentioning
confidence: 98%