2013
DOI: 10.1021/am402403x
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Surface Modification of a ZnO Electron-Collecting Layer Using Atomic Layer Deposition to Fabricate High-Performing Inverted Organic Photovoltaics

Abstract: A ripple-structured ZnO film as the electron-collecting layer (ECL) of an inverted organic photovoltaic (OPV) was modified by atomic layer deposition (ALD) to add a ZnO thin layer. Depositing a thin ZnO layer by ALD on wet-chemically prepared ZnO significantly increased the short-circuit current (Jsc) of the OPV. The highest power conversion efficiency (PCE) of 7.96% with Jsc of 17.9 mA/cm2 was observed in the inverted OPV with a 2-nm-thick ALD-ZnO layer, which quenched electron-hole recombination at surface d… Show more

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Cited by 59 publications
(55 citation statements)
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“…This was compensated by surface modification. 23,26,27 In this report, the wrinkled ZnO surface is modified by inserting an ultrathin electron conducting TP layer prior to depositing the active layer. This procedure leads to reduced bimolecular recombination at the electron extracting interface, which is evident from conducting and surface potential mapping measurements.…”
mentioning
confidence: 99%
“…This was compensated by surface modification. 23,26,27 In this report, the wrinkled ZnO surface is modified by inserting an ultrathin electron conducting TP layer prior to depositing the active layer. This procedure leads to reduced bimolecular recombination at the electron extracting interface, which is evident from conducting and surface potential mapping measurements.…”
mentioning
confidence: 99%
“…Another optical characteristic like photoluminescence (PL) spectroscopy has been widely used to determine the optical band structure, and also PL spectra in the high wavelength represents the status of the surface structure kinds of surface defects of ZnO thin film [22,25,26,30,31]. In conventional PL spectra of ZnO thin film, one can detect two major peaks, one is strong emission peaks in the UV region of 380 nm 400 nm which is related to the property of optical band gap.…”
Section: Resultsmentioning
confidence: 99%
“…Another peak in PL spectra shown in the region between 450 nm and 700 nm is giving information about surface defect such as oxygen vacancy and/or point defects of ZnO thin film [22,25,26,30,31]. It is already well known that surface oxygen vacancy of metal oxide film is quite important for the high electrical conductivity of the film.…”
Section: Resultsmentioning
confidence: 99%
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