Low-molecular weight model compounds (MCs) for Nafion membranes used in fuel cells were exposed at 300 K to Á OH radicals produced by UV irradiation of aqueous H 2 O 2 solutions. The MCs contained fluorinated and partially fluorinated groups terminated by sulphonic or carboxylic acid groups. The fragmentation process in the MCs was studied by spin trapping electron spin resonance (ESR) methods, using 5,5-dimethylpyrroline-N-oxide (DMPO), N-tert-butyla-phenylnitrone (PBN) and 2-methyl-2-nitrosopropane (MNP) as the spin traps. The objective of these experiments was to assess the effect of the type of ionic groups (sulphonic or carboxylic) and of fluorine substitution on the spin adducts detected. DMPO experiments led to the detection of spin adducts of Á OH and of carbon-centred radicals (CCRs), and allowed the determination of the Á OH attack site on the ionic and/or on the protiated or fluorinated groups. CCR adducts were also detected when using PBN as a spin trap; a key point in the interpretation of the PBN results was, however, the realisation that MNP is formed during PBN exposure to UV irradiation and oxygen or other oxidants such as H 2 O 2 . Experiments with MNP as the spin trap were the most informative in terms of structural details for adducts obtained from each MC. The results allowed the identification of CCRs present as adducts, based on large hyperfine splittings (hfs) from, and the number of, interacting 19 F nuclei; in addition, oxygen-centred radicals (OCRs) as MNP adducts were also identified, with much lower hfs from 19 F nuclei. Taken together, the results deduced by spin trapping suggest that both sulphonic acid and acetic acid groups can be attacked by Á OH radicals and confirm two possible degradation mechanisms in Nafion membranes: initiated at the backbone and at the side chain.