2015
DOI: 10.1016/j.apsusc.2015.04.113
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Surface morphology and grain analysis of successively industrially grown amorphous hydrogenated carbon films (a-C:H) on silicon

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Cited by 47 publications
(65 citation statements)
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References 40 publications
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“…For PECVD depositions of a‐C:H on several polymer materials, Catena et al observed a thickness‐dependent generation of specifically modified material properties on top, especially caused by the size of the carbon clusters and an increasing content of sp 2 ‐carbon centers . Similar observations were found by some of the authors for these a‐C:H depositions on silicon (100) wafers . On the basis of a considerable number of unsaturated carbon centers resp.…”
Section: Introductionsupporting
confidence: 67%
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“…For PECVD depositions of a‐C:H on several polymer materials, Catena et al observed a thickness‐dependent generation of specifically modified material properties on top, especially caused by the size of the carbon clusters and an increasing content of sp 2 ‐carbon centers . Similar observations were found by some of the authors for these a‐C:H depositions on silicon (100) wafers . On the basis of a considerable number of unsaturated carbon centers resp.…”
Section: Introductionsupporting
confidence: 67%
“…These azo‐compounds are then used for a photochemical deposition on amorphous hydrogenated layers containing sp 2 ‐carbon centers, as illustrated above. Present a‐C:H layers supported on Si(100) typically contain 30–40% of hydrogen and 30% of sp 3 ‐hybridized CC bindings along with an increasing sp 2 ‐content depending on the thickness, therefore being suitable for the Ru‐complex attachment . The analytical proof for a successful deposition of Ru‐polypyridyl complexes on a‐C:H layers by photochemical immobilization of the included azo group and their stable attachment is demonstrated here.…”
Section: Introductionmentioning
confidence: 75%
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“…The coating process is described in detail elsewhere [5,20,21], but here only briefly: Sample holders were placed 275 mm in front of the plasma source. This direct alignment results in so-called r-type diamond-like carbon (DLC) coatings [20][21][22][23]. An initial oxygen plasma (10 min, 200 W, 1 Pa, 65 sccm/min) cleaned and activated the PHB surface for further coating.…”
Section: Sample Preparation and Film Depositionmentioning
confidence: 99%
“…Tools like atomic force microscopy (AFM) perform well in terms of axial and lateral resolution, [6]. They have been shown to be excellent tools in laboratory environments for applications such as microbiology and nano-structured materials [7][8][9]. However, AFM measurements over areas larger than the standard (5 x 5 µm) require special installations and measurement times increase significantly, [10].…”
Section: Introductionmentioning
confidence: 98%