Surface Morphology and Microstructure of Direct Current Sputtering Growth of Buffer Layers for Ybco Coated Conductor

Abstract

A composite buffer of CeC^/YSZ/ Y2O3 was investigated on the biaxially textured NiW long tape for YBCO coated conductor with magnetron sputtering technique. Every layer's surface morphology was observed by scanning electron microscopy. The seed layer Y2O3 film was full coverage of the NiW substrate. The cap layer Ce02 showed a smooth and crack-free surface and good crystallinity. The roughness of Ce02 surface was measured by atom force microscopy. The transmission electron microscopy was used to analyze the cross-section of buffer layers and YBCO layer.