Drawing from both experimental data and simulation, we
highlight
best practices for fitting time-resolved photoluminescence (TRPL)
decays of halide perovskite semiconductors, which are now widely studied
for applications in photovoltaics and light-emitting diodes (LEDs).
First, at low excitation intensities, high-quality perovskites often
show pseudo-first-order kinetics, consistent with classic minority
carrier lifetimes. Second, multiexponential decays, frequently observed
at low excitation intensities, often have significant contributions
from spatial heterogeneity. We recommend fitting such decays with
stretched exponentials, where the stretching factor (β) can
be used to characterize the heterogeneity of the local lifetime distribution.
Third, PL decay kinetics can depend on the excitation wavelength.
We discuss how penetration depth, carrier diffusion, and surface recombination
affect measurements and make recommendations for choosing experimental
parameters suited to the question at hand. Accounting for these factors
will provide a more reliable and physical interpretation of carrier
recombination and better understanding of nonradiative losses in perovskite
semiconductors.