2015
DOI: 10.1002/ppap.201400240
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Surface Plasmon‐Based Techniques for the Analysis of Plasma Deposited Functional Films and Surfaces

Abstract: Herein we demonstrate that two surface plasmon-based techniques (i.e., SPR and OWS) allow for sensitive and real-time monitoring of plasma polymers of different thicknesses ranging from several nanometers to micrometers. Firstly, the fundamentals and the implementation of SPR/OWS are given. Examples about the use of SPR and OWS for the characterization of plasma deposited thin films are then presented, with emphasis on the stability and the swelling of those films in humid atmospheres and in aqueous media. The… Show more

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Cited by 14 publications
(14 citation statements)
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“…XPS curve analysis was conducted by using XPSpeak4.1. A custom‐built SPR setup based on the Kretschmann's configuration was used to measure the thickness of POEGMA brush . The light source was a He–Ne laser ( λ = 632.8 nm, laser power < 5 mW ).…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…XPS curve analysis was conducted by using XPSpeak4.1. A custom‐built SPR setup based on the Kretschmann's configuration was used to measure the thickness of POEGMA brush . The light source was a He–Ne laser ( λ = 632.8 nm, laser power < 5 mW ).…”
Section: Methodsmentioning
confidence: 99%
“…Surface plasmon resonance has proved to be a sensitive optical technique for the determination of polymer film's thickness provided that its refractive index is known. [29] To avoid the humidity effect, the POEGMA sample was attached onto a flow cell, which filled with nitrogen gas. Figure 4 shows the thickness evolution of various POEGMA brushes as a function of polymerization time.…”
Section: Synthesis Of Poegma Brushesmentioning
confidence: 99%
“…Fg (from bovine plasma, Sigma) adsorption was monitored using a commercial surface plasmon resonance (SPR) spectrometer (RES‐TEC RT2005, Germany) where a thin noble metal layer (in this case gold), on the base of a prism is irradiated with a 632 nm He/Ne laser beam, while the reflectivity is measured, over a range of incident angles. A detailed description of the technique and its principles can be found in a contribution by Chu et al Substrates used were 25 mm × 25 mm × 1.5 mm LaSFN9 glass slides coated with ∼2 nm of Cr and ∼40 nm of Au using a NexDep e‐beam evaporator (Angstrom Engineering Inc) and the test coatings (∼15 nm) were deposited on the gold surface. Platinum coatings of ∼7 nm thickness were deposited using a high vacuum sputter coater (Leica EM ACE600).…”
Section: Methodsmentioning
confidence: 99%
“…S1, Supporting Information). 41,42 Briefly, a He-Ne laser (λ = 632.8 nm, laser power <5 mW) was used as a light source. The light beam passed through a chopper and two polarizers, and was then reflected from the prism base, which was detected by a photodiode and a lock-in amplifier.…”
Section: Spr Analysismentioning
confidence: 99%