1995
DOI: 10.1016/0039-6028(94)00670-9
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Surface plasmon polariton radiation from silver films on fluoride films and surface roughness parameters of those silver films

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Cited by 4 publications
(4 citation statements)
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“…Similar σ parameters were found with an analogous experimental technique for silver covered LiF samples of d(LiF) 200 nm thickness [7].…”
Section: Light Emission Measurementssupporting
confidence: 83%
“…Similar σ parameters were found with an analogous experimental technique for silver covered LiF samples of d(LiF) 200 nm thickness [7].…”
Section: Light Emission Measurementssupporting
confidence: 83%
“…The transversal correlation length is denoted by o and the depth of corrugation or average height by 5 with 2 the mean square deviation from a plane surface. For small cS 20 A values for 6 and o may be determined via the efficiency of surface plasmon coupling in an attenuated total reflection (ATR) geometry [18,19]. For larger depths of corrugation scanning microscopy [20] is a more reliable method.…”
Section: Isolated Atoms Near Rough and Smooth Surfacesmentioning
confidence: 99%
“…This value is low but has been shown to be highly dependent on exposure to air and attributable to device degradation. [83] However, in absorption limited devices, the thickness of the active absorbing layers can be made thinner, which has previously been shown to signicantly increase η IQE by increasing the probability of exciton dissociation at the active interface [82]. Active semiconductor layers with thicknesses greater than the exciton diusion length lowers dissociation eciency.…”
Section: Energy Transfer Via Guided Modesmentioning
confidence: 99%
“…The correlation between surface roughness and directional light emission has been measured by several authors. [80,81,82] If we assume that the modeled η ABS provides an accurate prediction of absorption versus θ i , η IQE is estimated to be ∼ 20%. This value is low but has been shown to be highly dependent on exposure to air and attributable to device degradation.…”
Section: Energy Transfer Via Guided Modesmentioning
confidence: 99%