Surface plasmon resonance imaging of cell-substrate contacts with radially polarized beams

Moh, K. J.; Yuan, Xiaocong; Bu, Jing; Zhu, Siwei; Gao, Bruce Z.

doi:10.1364/oe.16.020734

Cited by 85 publications

(45 citation statements)

References 20 publications

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“…As demonstrations, we first examine the SPP patterns produced by focusing a cylindrical beam into a Kretschmann-type structure of a thin metal film deposited on a glass plate. For a radially polarized cylindrical beam22, the detected SPP pattern shows a center spot of 0.355 λ 0 , which agrees well with theory. Following the same methodology, we visualize directly nano-focusing and interferences of surface plasmon waves created by a particular class of plasmonic near-field lenses, further demonstrating the universal use of the developed near-field imaging method for more general evanescent wave characterizations at subwavelength scales.…”

supporting

confidence: 85%

Mapping plasmonic near-field profiles and interferences by surface-enhanced Raman scattering

Lei

Yuan

et al. 2013

Sci Rep

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Mapping near-field profiles and dynamics of surface plasmon polaritons is crucial for understanding their fundamental optical properties and designing miniaturized photonic devices. This requires a spatial resolution on the sub-wavelength scale because the effective polariton wavelength is shorter than free-space excitation wavelengths. Here by combining total internal reflection excitation with surface-enhanced Raman scattering imaging, we mapped at the sub-wavelength scale the spatial distribution of the dominant perpendicular component of surface plasmon fields in a metal nanoparticle-film system through spectrally selective and polarization-resolved excitation of the vertical gap mode. The lateral field-extension at the junction, which is determined by the gap-mode volume, is small enough to distinguish a spot size ~0.355λ0 generated by a focused radially polarized beam with high reproducibility. The same excitation and imaging schemes are also used to trace near-field nano-focusing and interferences of surface plasmon polaritons created by a variety of plasmon lenses.

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supporting

confidence: 85%

Mapping plasmonic near-field profiles and interferences by surface-enhanced Raman scattering

Lei

Yuan

et al. 2013

Sci Rep

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“…Many authors have advocated the use of radial polarisation in SP microscopy (Moh et al, 2008) and indeed we can see from Eq. (1) that this allows all the incident light to be ppolarised so that the magnitude of the V(z) oscillations is increased.…”

Section: Interferometric Microscopy Methods For Determination Of Locamentioning

confidence: 89%

Surface plasmon microscopy: resolution, sensitivity and crosstalk

Pechprasarn

Somekh

2012

Journal of Microscopy

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SummaryThis paper develops the theoretical framework to understand the capability of the interferometric surface plasmon microscope to quantify sample properties in a confined region. We use rigorous diffraction theory to quantify the ability of the system to measure local properties and eliminate crosstalk from adjacent regions. We argue that the interferometric system in the defocused condition defines the measured point of excitation and reradiation of the surface plasmons; which greatly improves localisation. We also present results for the noninterferometric microscope, which confirm that the interferometric based system can perform quantitative measurements over smaller regions.

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“…In this article, we report a variant of the plasmonic tweezers for trapping and manipulating metallic particles that is based on a highly focused plasmonic field on a flat metal film excited by a radially polarized (RP) beam (also called plasmonic virtual probe232425). This variant can attract and trap both Rayleigh- and Mie-type metallic particles.…”

mentioning

confidence: 99%

Focused plasmonic trapping of metallic particles

et al. 2013

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Scattering forces in focused light beams push away metallic particles. Thus, trapping metallic particles with conventional optical tweezers, especially those of Mie particle size, is difficult. Here we investigate a mechanism by which metallic particles are attracted and trapped by plasmonic tweezers when surface plasmons are excited and focused by a radially polarized beam in a high-numerical-aperture microscopic configuration. This contrasts the repulsion exerted in optical tweezers with the same configuration. We believe that different types of forces exerted on particles are responsible for this contrary trapping behaviour. Further, trapping with plasmonic tweezers is found not to be due to a gradient force balancing an opposing scattering force but results from the sum of both gradient and scattering forces acting in the same direction established by the strong coupling between the metallic particle and the highly focused plasmonic field. Theoretical analysis and simulations yield good agreement with experimental results.

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Surface plasmon resonance imaging of cell-substrate contacts with radially polarized beams

Cited by 85 publications

References 20 publications

Mapping plasmonic near-field profiles and interferences by surface-enhanced Raman scattering

Mapping plasmonic near-field profiles and interferences by surface-enhanced Raman scattering

Surface plasmon microscopy: resolution, sensitivity and crosstalk

Focused plasmonic trapping of metallic particles

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