2000
DOI: 10.1016/s0022-0248(00)00640-0
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Surface processes in OMVPE – the frontiers

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Cited by 41 publications
(17 citation statements)
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“…Tellurium, as a surfactant, can influence the layer composition by slightly unbalancing the incorporation of gallium and indium into the crystal lattice [1,2]. Additionally, if high dopant concentrations are pursued with a rather big atom such as tellurium, lattice distortion may appear, which can be interpreted as a variation in composition when analysed by XRD.…”
Section: Introductionmentioning
confidence: 99%
“…Tellurium, as a surfactant, can influence the layer composition by slightly unbalancing the incorporation of gallium and indium into the crystal lattice [1,2]. Additionally, if high dopant concentrations are pursued with a rather big atom such as tellurium, lattice distortion may appear, which can be interpreted as a variation in composition when analysed by XRD.…”
Section: Introductionmentioning
confidence: 99%
“…A comparison of the effect of Group V surfactants on the metal organic vapor phase epitaxy (MOVPE) of GaInP shows the thermodynamic influence of Sb and Bi to be more distinct than that of As, with Sb replacing surface P dimer, and Bi increasing the step growth velocity [13]. Similarly, As has been shown to induce thermodynamically driven surface reconstructions on GaN(0 0 0 1) [14].…”
Section: Introductionmentioning
confidence: 99%
“…3 [41]. The TESb partial pressure is normalized by the total group III precursor partial pressure, since both Sb and the group III elements are relatively non-volatile.…”
Section: Article In Pressmentioning
confidence: 99%
“…The larger spacing of the Sb dimers Degree of order for GaInP layers grown by OMVPE plotted versus the surfactant/III ratio in the vapor. Data are for Bi (E), Sb (&), and As (m) (after Stringfellow et al[41]). …”
mentioning
confidence: 99%
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