Surface properties of Al2O3:ZnO thin films growth on FTO for photovoltaic application

Effects of Lithium Salt on Optical and Structural Properties of ZnO Thin Films

“…Where, α is the absorption coefficient, which measures the absorption of the film in the UV-Vis spectrum, estimating where the transition happens inside the structure, from valence to conduction band; R is the reflectance measured in the same spectrum, indicating where in the wavelength the layer reflects the incident light; d is the layer thickness estimated by the absorption coefficient calculated by the K-M relation; and T is the transmittance of the film, in the ultraviolet and visible range, showing where the light passes through the film, which can be an indication that the material may be used in transparent devices. The same Kubelka-Munk method can be found in [32]. The results show that the film with the higher reflectance (5%) had lower absorbance values, which can be used in transparent optical devices.…”