1997
DOI: 10.1021/ma970869a
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Surface Relaxations in Polymers

Abstract: Near-edge X-ray absorption fine structure, NEXAFS, spectroscopy was used to investigate the relaxations of polystyrene, a typical amorphous polymer, near a free surface after the imposition of a small deformation. Using synchrotron radiation, the NEXAFS dichroic ratio was determined for both the Auger and total electron yield processes as a function of temperature to determine the orientation of the polymer in the first 1 and 10 nm from the free surface, respectively. Complete relaxation of the polymer was not… Show more

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Cited by 169 publications
(197 citation statements)
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“…9 In particular, good quantitative agreement between the change in T g 19 and the change in T 0 as the PS film thickness is decreased from 50 to 10 nm supports the viewpoint that T 0 is directly related to T g . 8,9 This result, consistent with the previous finding that T 0 has the same M w dependence as T g , 12 suggests that the ␣ relaxation may dominate the observed relaxations of the rubbed PS films near T g . Moreover, at thicknesses greater than 30 nm, the T 0 's of PS films on HOSi are lower than those on SiO 2 surfaces.…”
Section: Resultssupporting
confidence: 89%
See 1 more Smart Citation
“…9 In particular, good quantitative agreement between the change in T g 19 and the change in T 0 as the PS film thickness is decreased from 50 to 10 nm supports the viewpoint that T 0 is directly related to T g . 8,9 This result, consistent with the previous finding that T 0 has the same M w dependence as T g , 12 suggests that the ␣ relaxation may dominate the observed relaxations of the rubbed PS films near T g . Moreover, at thicknesses greater than 30 nm, the T 0 's of PS films on HOSi are lower than those on SiO 2 surfaces.…”
Section: Resultssupporting
confidence: 89%
“…Similar behavior has been observed before. 8,9 For PS films on SiO 2 , T 0 becomes smaller for thinner films. For PS films on HOSi, however, T 0 remains the same for all thicknesses.…”
Section: Resultsmentioning
confidence: 99%
“…8,18 Experiments using near-edge X-ray absorption fine-structure (NEXAFS) on rubbed polystyrene films have shown almost no difference in the rate of relaxation between polymer chains within 1 nm of the surface and chains within 10 nm of the surface, again indicating a small influence of the surface on the system's dynamics. 18 On the other hand, Monte Carlo simulations have shown a higher mobility at polymer-air surfaces, due to a reduction in density. 17 However, this effect does not extend more than a few segmental diameters into the film.…”
Section: Introductionmentioning
confidence: 99%
“…Other methods involve dilatometric measurements for the determination of the specific volume, mechanical property measurements (thermomechanical analysis, TMA, and dynamic mechanical analysis, DMA), and dielectric measurements [4]. Near-edge X-ray absorption fine structure (NEXAFS) spectroscopy [12], x-rays diffraction [13], slow-positron-annihilation spectroscopy (SPAP) [14,15], brillouin light scattering (BLS) [16,17], photon correlation spectroscopy and quartz crystal microbalance techniques [18], spectroscopic ellipsometry (SE) [19], attenuated total reflection (ATR) [20], and scanning probe microscopy (SPM) [21][22][23][24][25][26][27] have all been employed to determine T g for thin polymer films.…”
Section: Macromolecular Probing Techniquesmentioning
confidence: 99%