2020
DOI: 10.1016/j.apsusc.2020.147142
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Surface roughness effect on the electrical characteristics of Pd/SiC nanocontacts

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Cited by 6 publications
(3 citation statements)
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“…, where Φ Pd is ≈5.2 eV and TiO2 χ is ≈4.15 eV. [41,42] The depleting characteristics are evidenced by current-voltage (I-V) test under dark condition. With the relatively smaller Pd NPs, S3 showed a much decreased current as compared with TiO x as shown in Figure 6g.…”
Section: Wwwadvopticalmatdementioning
confidence: 99%
See 1 more Smart Citation
“…, where Φ Pd is ≈5.2 eV and TiO2 χ is ≈4.15 eV. [41,42] The depleting characteristics are evidenced by current-voltage (I-V) test under dark condition. With the relatively smaller Pd NPs, S3 showed a much decreased current as compared with TiO x as shown in Figure 6g.…”
Section: Wwwadvopticalmatdementioning
confidence: 99%
“…[ 5 ] And according to the wok function of Pd, Φ Pd , and electron affinity of TiO 2 , χTiO2, the energy barrier Φ B can be estimated as 1.05 eV from Pd side as seen in Figure 6f according to the theoretical calculation via normalΦnormalB= normalΦPdχTiO2, where Φ Pd is ≈5.2 eV and χTiO2 is ≈4.15 eV. [ 41,42 ] The depleting characteristics are evidenced by current–voltage ( I – V ) test under dark condition. With the relatively smaller Pd NPs, S3 showed a much decreased current as compared with TiO x as shown in Figure 6g.…”
Section: Figurementioning
confidence: 99%
“…Especially, the interface roughness and the size of the grains are the most effective mechanisms. A high grain size will reduce grain boundary scattering, while a less rough surface will prevent large amounts of scattering caused by surface roughness [45]. Thus, as electron mobility increases, conductivity increases.…”
Section: Resultsmentioning
confidence: 99%