1992
DOI: 10.1016/0169-4332(92)90403-k
|View full text |Cite
|
Sign up to set email alerts
|

Surface structural changes during the initial growth of Ge on Si(111)7 × 7

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

1994
1994
2015
2015

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 18 publications
(1 citation statement)
references
References 21 publications
0
1
0
Order By: Relevance
“…Pure Ge layers have also been deposited onto Si substrates using MBE or CVD methods and various aspects of the deposition process or the resulting heterostructure have been studied. [27][28][29][30][31][32][33][34][35][36][37][38][39][40][41] The main CVD precursor gases studied have been Ge 2 H 6 , GeH 4 , and GeCl 4 . For the gaseous hydride precursors, CVD proceeds via (i) adsorption, (ii) decomposition, and (iii) desorption of hydrogen to free dangling bond sites for further deposition.…”
Section: Introductionmentioning
confidence: 99%
“…Pure Ge layers have also been deposited onto Si substrates using MBE or CVD methods and various aspects of the deposition process or the resulting heterostructure have been studied. [27][28][29][30][31][32][33][34][35][36][37][38][39][40][41] The main CVD precursor gases studied have been Ge 2 H 6 , GeH 4 , and GeCl 4 . For the gaseous hydride precursors, CVD proceeds via (i) adsorption, (ii) decomposition, and (iii) desorption of hydrogen to free dangling bond sites for further deposition.…”
Section: Introductionmentioning
confidence: 99%