2006
DOI: 10.1524/zpch.2006.220.10.1439
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Surface Studies on the Ionic Liquid 1-Ethyl-3-Methylimidazolium Ethylsulfate Using X-Ray Photoelectron Spectroscopy (XPS)

Abstract: Surface studies of ionic liquids are particularly important for all kinds of multiphasic operations employing ionic liquids, e.g. biphasic homogeneous catalysis or supported ionic liquid phase catalysis. Using X-ray photoelectron spectroscopy (XPS), the surface composition of the model system 1-ethyl-3-methylimidazolium ethylsulfate [EMIM][EtOSO3] was investigated. By comparing two different samples of this ionic liquid from two different origins, we observed a decisive influence of silicon containing impuriti… Show more

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Cited by 111 publications
(129 citation statements)
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“…An increased signal at 80°(that is, in the surface sensitive geometry), indicates an enrichment of this element in the topmost layers as compared to the bulk; correspondingly, a decreased signal at 80°indicates a depletion of this element in the topmost layers. Deviations of the surface composition from that in the bulk can be due to a pronounced preferential orientation of cations or anions in the IL, due to surface enrichment or depletion of one component in a mixture or a solution of ILs, but also due to the surface enrichment of contaminations [142,147].…”
Section: Molecular Insights Into Il/gas and Il/support Interfacesmentioning
confidence: 99%
“…An increased signal at 80°(that is, in the surface sensitive geometry), indicates an enrichment of this element in the topmost layers as compared to the bulk; correspondingly, a decreased signal at 80°indicates a depletion of this element in the topmost layers. Deviations of the surface composition from that in the bulk can be due to a pronounced preferential orientation of cations or anions in the IL, due to surface enrichment or depletion of one component in a mixture or a solution of ILs, but also due to the surface enrichment of contaminations [142,147].…”
Section: Molecular Insights Into Il/gas and Il/support Interfacesmentioning
confidence: 99%
“…In the fi rst XPS study of the surface of a commercially available IL a signifi cant Si contamination was found, [ 36 ] which was probably due to a silicon-containing grease used to seal the glassware applied during synthesis. [ 50 ] This contamination is obviously highly surface active, as it could not be detected using bulk sensitive methods with a detection limit in the ppm range. Furthermore, XPS measurements allowed to quantify other carbon and oxygen containing contaminations of imidazolium based ILs, which again were below the detection limit of bulk sensitive methods.…”
Section: Surface Contaminationsmentioning
confidence: 99%
“…Clearly, the intensities of C and O are higher than the theoretical values, which may be caused by trace organic contaminations introduced during synthesis. In addition, the presence of Si-containing surface contaminants might also contribute to the excessive oxygen concentration, [43] although no Si signal was detected (possibly < 0.3 wt %). The enrichment of F in the IL surface can be explained by the facts that fluorine has a high relative sensitivity factor (RSF = 1), and that the atoms of fluorine-containing anions involved in emissive processes are not affected by shake-up/off events.…”
Section: Esi-msmentioning
confidence: 99%
“…[44] Figure 9 a gives the XPS spectra of [S2]DCA, which are free from O and F. Besides the IL-related signals (C, S, and N), we observed trace Si-containing contaminants, which might originate from the sealing of the storage container or the silicone grease introduced during synthesis. [43,44] The S 2p spectrum of [S2]DCA is shown in Figure 9 b. The B.E.…”
Section: Esi-msmentioning
confidence: 99%