Surface termination of BaTiO3 (001) single crystals: A combined electron spectroscopic and theoretical study

Berlich, Andrea; Strauss, H.; Langheinrich, Ch.; Chassé, A.; Morgner, Harald

doi:10.1016/j.susc.2010.10.014

Cited by 24 publications

(16 citation statements)

References 26 publications

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“…In this case, the bulk and surface-sensitive Sr 3d and Ti 2p peaks have been normalized so that the Ti 2p peaks show the same total peak area, which highlights the smaller peak area for the surface-sensitive Sr 3d peak relative to its bulk counterpart. An additional source of information is the presence of surface core-level shifts that can be measured due to incomplete coordination or OH adsorption of surface A-site ions, as has been shown for Ba-terminated BaTiO 3 , which shows a distinct peak at higher binding energy for the Ba 3d peak [84]. Using these approaches while understanding the kinetics of the growth process can make in situ XPS particularly valuable for quick tuning of growth parameters sample-to-sample.…”

Section: Film Stoichiometry and Surface Terminationmentioning

confidence: 99%

Probing surfaces and interfaces in complex oxide films via in situ X-ray photoelectron spectroscopy

Thapa

Paudel

Blanchet

et al. 2021

Journal of Materials Research

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Emergent behavior at oxide interfaces has driven research in complex oxide films for the past 20 years. Interfaces have been engineered for applications in spintronics, topological quantum computing, and high-speed electronics with properties not observed in bulk materials. Advances in synthesis have made the growth of these interfaces possible, while X-ray photoelectron spectroscopy (XPS) studies have often explained the observed interfacial phenomena. This review discusses leading recent research, focusing on key results and the XPS studies that enabled them. We describe how the in situ integration of synthesis and spectroscopy improves the growth process and accelerates scientific discovery. Specific techniques include determination of interfacial intermixing, valence band alignment, and interfacial charge transfer. A recurring theme is the role that atmospheric exposure plays on material properties, which we highlight in several material systems. We demonstrate how synchrotron studies have answered questions that are impossible in lab-based systems and how to improve such experiments in the future.

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Section: Film Stoichiometry and Surface Terminationmentioning

confidence: 99%

Probing surfaces and interfaces in complex oxide films via in situ X-ray photoelectron spectroscopy

Thapa

Paudel

Blanchet

et al. 2021

Journal of Materials Research

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“…To date, both quantities are typically determined separately using established non-destructive techniques such as X-ray photoelectron diffraction 23 24 , ion scattering spectroscopy 25 , coaxial impact collision ion scattering spectroscopy 26 , scanning transmission electron microscopy 4 27 , and scanning probe microscopy 5 28 29 30 for the termination and Rutherford backscattering spectrometry as well as X-ray photoelectron spectroscopy (XPS) for the stoichiometry 18 19 20 . While XPS presents the most accessible tool for the determination of thin film stoichiometry, the impact of the termination layer is usually not taken into account when the films are compared to reference data, although Zhang et al .…”

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confidence: 99%

Surface Termination Conversion during SrTiO3 Thin Film Growth Revealed by X-ray Photoelectron Spectroscopy

Baeumer

Gunkel

et al. 2015

Sci Rep

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Emerging electrical and magnetic properties of oxide interfaces are often dominated by the termination and stoichiometry of substrates and thin films, which depend critically on the growth conditions. Currently, these quantities have to be measured separately with different sophisticated techniques. This report will demonstrate that the analysis of angle dependent X-ray photoelectron intensity ratios provides a unique tool to determine both termination and stoichiometry simultaneously in a straightforward experiment. Fitting the experimental angle dependence with a simple analytical model directly yields both values. The model is calibrated through the determination of the termination of SrTiO3 single crystals after systematic pulsed laser deposition of sub-monolayer thin films of SrO. We then use the model to demonstrate that during homoepitaxial SrTiO3 growth, excess Sr cations are consumed in a self-organized surface termination conversion before cation defects are incorporated into the film. We show that this termination conversion results in insulating properties of interfaces between polar perovskites and SrTiO3 thin films. These insights about oxide thin film growth can be utilized for interface engineering of oxide heterostructures. In particular, they suggest a recipe for obtaining two-dimensional electron gases at thin film interfaces: SrTiO3 should be deposited slightly Ti-rich to conserve the TiO2-termination.

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“…The typical methods used to prepare clean, atomically-flat surfaces on single crystal BTO substrates entail polishing, 10 sputtering, 11 etching, 12 and annealing. 11,13 All of these steps modify the structure and surface chemistry of the sample, making it more difficult to draw conclusions about how an ideal BTO surface behaves. Among these techniques, only annealing can yield atomically-flat surfaces.…”

Section: Cleavage and Atomic Terracesmentioning

confidence: 99%

Friction imprint effect in mechanically cleaved BaTiO3 (001)

Long

Ebeling

Solares

et al. 2014

Journal of Applied Physics

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Adsorption, chemisorption, and reconstruction at the surfaces of ferroelectric materials can all contribute toward the pinning of ferroelectric polarization, which is called the electrical imprint effect. Here, we show that the opposite is also true: freshly cleaved, atomically-flat surfaces of (001) oriented BaTiO 3 exhibit a persistent change in surface chemistry that is driven by ferroelectric polarization. This surface modification is explored using lateral force microscopy (LFM), while the ferroelectric polarization is probed using piezoresponse force microscopy (PFM). We find that immediately after cleaving BaTiO 3 , LFM reveals friction contrast between ferroelectric domains. We also find that this surface modification remains after the ferroelectric domain distribution is modified, resulting in an imprint of the original ferroelectric domain distribution on the sample surface. This friction imprint effect has implications for surface patterning as well as ferroelectric device operation and failure. a) This research was performed while D. Ebeling and S. D. Solares were at the

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Surface termination of BaTiO3 (001) single crystals: A combined electron spectroscopic and theoretical study

Cited by 24 publications

References 26 publications

Probing surfaces and interfaces in complex oxide films via in situ X-ray photoelectron spectroscopy

Probing surfaces and interfaces in complex oxide films via in situ X-ray photoelectron spectroscopy

Surface Termination Conversion during SrTiO3 Thin Film Growth Revealed by X-ray Photoelectron Spectroscopy

Friction imprint effect in mechanically cleaved BaTiO3 (001)

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