In this paper, the development of a new device for high temperature emissivity measurement is described. This device aims at measuring both spectral and total emissivity for a thermal range of 600 to 1000°C. The device main targeted properties were both versatility and simplicity. To do so, a rigorous selection was made for each component: heating system, heat source, sample holder, measuring devices. Sample dimensions and the corresponding sample holder were optimized through a ray tracing model computation. Selection of sensors to compute a total emissivity was also especially discussed. A NIR spectrometer, and two MIR cameras covering [3-5] and [7.5-13]µm equipped with optical filters were chosen for spectral measurements. The major impediment was the separation between sample signal and various spurious signals emitted by environment. A specific measurement methodology was then made for each bandwidth to resolve this issue. A reference material was chosen for the device validation: Platinum. Spectral emissivity measurements were then compared to values from a commercial spectrometer. A good agreement was found for NIR and the first MIR band measurements and a higher error was seen in MIR second band which is explained by a less favorable signal to noise ratio. Integrated emissivity is then calculated and compared to values found in the literature. A good agreement between those values is found and similar trends with temperature are observed. The device is then validated for spectral and total emissivity measurement. Device versatility and simplicity allows an easy adaptation to a large area of applications.