2004
DOI: 10.1109/temc.2004.831842
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Susceptibility of Some Electronic Equipment to HPEM Threats

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Cited by 244 publications
(60 citation statements)
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“…6) [6], in addition to irreversible destructions that really occur frequently, unlike very rare upsets of discrete semiconductor elements.…”
Section: Susceptibility Of Integral Circuits (Microchips)mentioning
confidence: 99%
“…6) [6], in addition to irreversible destructions that really occur frequently, unlike very rare upsets of discrete semiconductor elements.…”
Section: Susceptibility Of Integral Circuits (Microchips)mentioning
confidence: 99%
“…As the high intensity sources, such as microwave oven, have easy access to public, the safety of information equipment faces great challenges [1]. In recent years, nonlinear structures, which load diodes or varactors, appear and present power-dependent properties.…”
Section: Introductionmentioning
confidence: 99%
“…the electromagnetic topology (EMT) (Baum, 1980) approach, the fault tree analysis (FTA) (Genender et al, 2011b) and Bayesian networks (BN) (Mao and Zhou, 2010;Mao et al, 2011). To calculate the risk with one of these three methods, it is necessary to acquire all the data for the calculation by many different measurements of its subsystems.…”
Section: Introductionmentioning
confidence: 99%