2016
DOI: 10.1007/978-3-319-33561-2_8
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Swift Heavy Ion Irradiation of Crystalline Insulators and Metals

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(2 citation statements)
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“…TEM), as well as quantifying the size of continuous ion tracks in the presence of high pre-existing damage levels. It should also be mentioned that indirect methods are particularly useful for determining S e th values, which are difficult to assess by TEM [60] because track radii are often lower than 2 nm for low S e values and are obscured by the presence of high pre-damage levels, such as in the present study. Therefore, a direct-impact model [61,62] is utilized to describe the increase in relative disorder at constant depth with increasing ion fluence for both 18 MeV Si and 91.6 MeV Xe ions.…”
Section: Discussionmentioning
confidence: 76%
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“…TEM), as well as quantifying the size of continuous ion tracks in the presence of high pre-existing damage levels. It should also be mentioned that indirect methods are particularly useful for determining S e th values, which are difficult to assess by TEM [60] because track radii are often lower than 2 nm for low S e values and are obscured by the presence of high pre-damage levels, such as in the present study. Therefore, a direct-impact model [61,62] is utilized to describe the increase in relative disorder at constant depth with increasing ion fluence for both 18 MeV Si and 91.6 MeV Xe ions.…”
Section: Discussionmentioning
confidence: 76%
“…Consequently, the S e -induced formation of continuous or discontinuous amorphous ion tracks is the primary process responsible for the enhanced disordering rate in KTaO 3 with pre-existing damage. It is well established [27,60] that indirect methods (i.e. RBS/C) are more powerful in quantifying the size of discontinuous ion track than direct observation methods (i.e.…”
Section: Discussionmentioning
confidence: 99%