Switch-on Phenomena and Field Emission from Single-Walled Carbon Nanotubes Embedded in Glass

Daradkeh, Samer; Mousa, Marwan S.

doi:10.9729/am.2017.47.3.86

Cited by 3 publications

(1 citation statement)

References 22 publications

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“…Carbon nanomaterials such as carbon nanotubes, carbon nanofibers and graphene have attracted significant interest as efficient electron emitters due to their potential application in future flat panel displays, electron beam instruments and x-ray sources [1][2][3][4][5][6][7]. There are several advantages of carbon nanomaterials-based electron emitters such as high aspect ratio, sharp tip and chemical inertness leading to the restrain of applied voltage to emit electrons even at low vacuum pressure [8][9][10][11][12]. In general, carbon nanotubes and graphene are usually synthesised at high temperature process [13][14][15][16][17][18][19].…”

Section: Introductionmentioning

confidence: 99%

In Situ Transmission Electron Microscope: Joule Heating Effect on Graphitization of Copper Incorporated Carbon Nanofiber

‘Azizir-Rahim

Yusop

Othman

et al. 2019

IJAME

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The joule heating process on copper (Cu) incorporated carbon nanofiber was observed carefully under the in-situ transmission electron microscope (TEM) facilities. Significant structural formation was occurred after the joule heating process showing a single crystalline encapsulated graphitic structure with dramatic improvement on graphitic structure of carbon nanofiber from amorphous to crystalline. The latter structure knowingly similar to multi-layered graphene structure. This Cu incorporated carbon nanofiber initially was shaped by the mixture of amorphous carbon and very fine crystalline Cu structure significantly changed by the effect of applied bias voltage. The change of Cu particles crystallinity also showing that the important of crystalline structure for the graphene formation. The in situ TEM results might provide very useful information on the formation of graphene and the solid phase reaction which is very interesting and vital in the graphene synthesis mechanism.

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Section: Introductionmentioning

confidence: 99%

In Situ Transmission Electron Microscope: Joule Heating Effect on Graphitization of Copper Incorporated Carbon Nanofiber

‘Azizir-Rahim

Yusop

Othman

et al. 2019

IJAME

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Silicon field emitters fabricated by dicing-saw and wet-chemical-etching

Edler

Schels

Biba

et al. 2021

Journal of Vacuum Science &Amp; Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phen

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Silicon field emitter arrays (FEAs) with different tip sizes and quantities were fabricated by saw dicing and anisotropic wet chemical etching by tetramethylammonium hydroxide. The tip is formed by the different etching rates of the crystal facets leading to a sharp pyramid based on {103} planes on the top and a hexadecagon based on {331} and {221} planes on the bottom. Electrical measurements at 10−5 mbar up to 10 μA show good reproducibility for FEAs with the same process parameters and higher uniformity and stability with an increasing number of tips. Constant current measurements at the same conditions and 10 μA show a mean electric field increase of about 0.06(3) V/(μm h) for p-type FEAs with a tip quantity of 3600. The shift increases with lower tip quantity and is higher for n-type FEAs compared to p-type. The degradation during the constant current measurement of n-type samples is found to be partly reversible by heating to 200 °C during emission. In contrast, heating of p-type FEAs induced further degradation instead of a regeneration effect.

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In situ quantitative field emission imaging using a low-cost CMOS imaging sensor

Schels

Edler

Herdl

et al. 2022

Journal of Vacuum Science &Amp; Technology B

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Spatially resolved field emission measurements represent an important factor in further development of existing field emitter concepts. In this work, we present a novel approach that allows quantitative analysis of individual emission spots from integral current-voltage measurements using a low-cost and commercially available CMOS camera. By combining different exposure times to extrapolate oversaturated and underexposed pixels, a near congruence of integral current and image brightness is shown. The extrapolation also allows parallel investigation of all individual tips participating in the total current with currents ranging from a few nanoampere to one microampere per tip. The sensitivity, which is determined by the integral brightness-to-current ratio, remains unchanged within the measurement accuracy even after ten full measurement cycles. Using a point detection algorithm, the proportional current load of each individual tip of the field emitter array is analyzed and compared at different times during the initial measurement cycle. Together with the extracted I–V curves of single emission spots from the integral measurement, the results indicate the effect of premature burnout of particularly sharp tips during conditioning of the emitter.

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Switch-on Phenomena and Field Emission from Single-Walled Carbon Nanotubes Embedded in Glass

Cited by 3 publications

References 22 publications

In Situ Transmission Electron Microscope: Joule Heating Effect on Graphitization of Copper Incorporated Carbon Nanofiber

In Situ Transmission Electron Microscope: Joule Heating Effect on Graphitization of Copper Incorporated Carbon Nanofiber

Silicon field emitters fabricated by dicing-saw and wet-chemical-etching

In situ quantitative field emission imaging using a low-cost CMOS imaging sensor

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