Symbolic-Event-Propagation-Based Minimal Test Set Generation for Robust Path Delay Faults

Mondal, Arijit; Chakrabarti, P. P.; Dasgupta, Pallab

doi:10.1145/2348839.2348851

Cited by 5 publications

(1 citation statement)

References 18 publications

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“…Delay fault models capture the behaviors of delay defects in order to enable fault simulation and test generation to be carried out [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17]. Transition faults [1] model the case where a large extra delay is local to a line.…”

Section: Introductionmentioning

confidence: 99%

Target Faults for Test Compaction Based on Multicycle Tests

Pomeranz

2020

ACM Trans. Des. Autom. Electron. Syst.

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The use of multicycle tests, with several functional capture cycles between scan operations, contributes significantly to the ability to compact a test set. Multicycle tests have the added benefit that they can contribute to the detection of defects with complex behaviors that are not detected by single-cycle or two-cycle tests. To ensure that this benefit is materialized when test compaction is applied to transition faults, this article suggests to incorporate into the test compaction procedure an additional fault model whose fault coverage increases when multicycle tests are used. To ensure that the computational complexity of test compaction is not increased by a fault model with a large number of faults, or faults with complex behaviors, the added fault model is required to have the same characteristics as the transition fault model. A type of transition fault called unspecified transition fault satisfies these requirements. The article describes a test compaction procedure for transition faults that incorporates unspecified transition faults, and presents experimental results for benchmark circuits to demonstrate the levels of test compaction and fault coverage that can be achieved.

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Section: Introductionmentioning

confidence: 99%

Target Faults for Test Compaction Based on Multicycle Tests

Pomeranz

2020

ACM Trans. Des. Autom. Electron. Syst.

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Non-Masking Non-Robust Tests for Path Delay Faults

Pomeranz

2020

2020 IEEE 38th VLSI Test Symposium (VTS)

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Boundary-Functional Broadside and Skewed-Load Tests

Pomeranz

2018

ACM Trans. Des. Autom. Electron. Syst.

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Close-to-functional broadside tests are used for avoiding overtesting of delay faults that can result from non-functional operation conditions, while avoiding test escapes because of faults that cannot be detected under functional operation conditions. When a close-to-functional broadside test deviates from functional operation conditions, the deviation can affect the entire circuit. This article defines the concept of a boundary-functional broadside test where non-functional operation conditions are prevented from crossing a preselected boundary. Using the procedure described in this article, the boundary maintains the same values under a boundary-functional broadside test as under a functional broadside test from which it is derived. Indirectly, this ensures that the deviations from functional operation conditions throughout the entire circuit are limited. The concept of a boundary-functional broadside test is extended to skewed-load tests, and to partial-boundary-functional tests. Experimental results are presented for benchmark circuits to demonstrate the fault coverage improvements that can be achieved using boundary-functional broadside and skewed-load tests as well as partial-boundary-functional tests of both types.

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Symbolic-Event-Propagation-Based Minimal Test Set Generation for Robust Path Delay Faults

Cited by 5 publications

References 18 publications

Target Faults for Test Compaction Based on Multicycle Tests

Target Faults for Test Compaction Based on Multicycle Tests

Non-Masking Non-Robust Tests for Path Delay Faults

Boundary-Functional Broadside and Skewed-Load Tests

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