1996
DOI: 10.1107/s0108767395011196
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Symmetry Analysis of Interface Triple Junctions

Abstract: The symmetry properties of triple junctions formed by crystal interfaces are presented using colour crystallography. Triple junctions are treated as composites of three crystals and are studied using the principle of superposition of symmetries. The conclusions are used for the understanding of the equivalences and invariances within one tricrystal composite and for studying such composites from the point of view of interfacial connectivity. A dissymmetrization procedure is established through which tricrystal… Show more

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Cited by 11 publications
(9 citation statements)
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“…The triple junctions in this microstructure correspond to the case considered in Fig. 5 of Dimitrakopulos & Karakostas (1996). It is easy to see that this polycrystal has AE multi 9 ( AE GB 9).…”
mentioning
confidence: 99%
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“…The triple junctions in this microstructure correspond to the case considered in Fig. 5 of Dimitrakopulos & Karakostas (1996). It is easy to see that this polycrystal has AE multi 9 ( AE GB 9).…”
mentioning
confidence: 99%
“…The triple junctions in this microstructure correspond to the case considered in Fig. 8 of Dimitrakopulos & Karakostas (1996). It is certainly possible to generate AE27a grain boundaries in this network by simple topological transformations.…”
mentioning
confidence: 99%
“…It would also be possible to include shape changes due to phase transformations and the generation of additional grain and interfacial defects through deformation processes. The discussion has been limited to topological aspects, and needs to include thermodynamic [30] and further symmetry considerations [23] to be comprehensive. We have described a crystallographic framework using the notion of circuit mapping to characterise junction lines.…”
Section: Discussionmentioning
confidence: 99%
“…In this case, a polychromatic complex [23] must be defined, and a circuit initially constructed around the junction line must subsequently be mapped into this space. Any closure failure of the mapped circuit can then be identified and hence the defect character of the junction line established.…”
Section: Characterisation Of Lnterfacial Defectsmentioning
confidence: 99%
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