Proceedings. IEEE INFOCOM '90: Ninth Annual Joint Conference of the IEEE Computer and Communications Societies@m_The Multiple F
DOI: 10.1109/infcom.1990.91295
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Synchronizable protocol test generation via the duplex technique

Abstract: A new technique is proposed for generating a synchronizable test sequence to ensure a protocol implementation conformity to the protocol specification. This duplex technique involves the conversion from the transition graph of a protocol into the duplex graph so as to generate a synchronizable test sequence for the protocol. By introducing the Chinese Postman Tour, this technique can be applied to the Transition-Tour method for generating the optimally synchronizable test sequence.

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Cited by 8 publications
(5 citation statements)
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“…In the traditional test approaches, the synchronization problem may occur in some conditions [10], [23]. For example, there is a synchronization problem in the following two consecutive test events: 11/O1, 12/02, where ll is input from LT, Oi is output to LT, and 12 is input from UT.…”
Section: Discussionmentioning
confidence: 99%
“…In the traditional test approaches, the synchronization problem may occur in some conditions [10], [23]. For example, there is a synchronization problem in the following two consecutive test events: 11/O1, 12/02, where ll is input from LT, Oi is output to LT, and 12 is input from UT.…”
Section: Discussionmentioning
confidence: 99%
“…In [CLC90] Chen, et al defined a tightly synchronizable test sequence of a two-port FSM as a test sequence such that for any two consecutive transitions, the input port of the second transition is the same as the output port of the first transition. (Each transition was assumed to have at most one output symbol.)…”
Section: Previous Work On Synchronizable Test Sequences Of An Fsmmentioning
confidence: 99%
“…In [UW93] Ural and Wang considered two-port FSMs satisfying a number of conditions, including the necessary and sufficient condition in [BU91] and the condition that each state in the FSM possess two UIO sequences, one for the L-tester and the other for the U-tester. By modifying the algorithm in [CLC90] for the construction of a duplex digraph and by providing additional algorithms, they showed how to find a pair-synchronizable UIO-based test sequence of an FSM in polynomial time. In In [CU95] Chen and Ural allowed the L-and U-testers for a two-port FSM to communicate with each other, and they considered the cost of such communication in test sequence generation.…”
Section: Previous Work On Synchronizable Test Sequences Of An Fsmmentioning
confidence: 99%
“…In order to distinguish the type of synchronizable test sequence defined in (Sarikaya and Bochmann, 1984) from other types of synchronizable test sequences, the former is referred to as a pair-synchronizable test sequence in the remainder of this paper. (Chen et al, 1990) defmed a tightly synchronizable test sequence of a two-port FSM as a test sequence such that for any two consecutive transitions, the input port of the second transition is the same as the output port of the first transition. (Each transition was assumed to have at most one output symbol.)…”
Section: Figure 1 Fsm MI With Ports Pi P2 and P3mentioning
confidence: 99%
“…(Ural and Wang, 1993) considered two-port FSMs satisfying a number of conditions, including the necessary and sufficient condition in (Boyd and Ural, 1991) and the condition that each state in the FSM possess two UIO sequences, one for the L-tester and the other for the Utester. By modifying the algorithm in (Chen et al, 1990) for the construction of a duplex digraph and by providing additional algorithms, they showed how to find a pair-synchronizable UIObased test sequence of an FSM in polynomial time. (Guyot and Ural, 1995) extended the work by showing the construction of a digraph of an FSM M such that all paths in the digraph are pairsynchronizable test sequences of M and by showing that under certain conditions, a pairsynchronizable test sequence ofM can distinguish M from any FSM not isomorphic to M. (Chen and Ural, 1995) allowed the L-and U-testers for a two-port FSM to communicate with each other, and they considered the cost of such communication in test sequence generation.…”
Section: Figure 1 Fsm MI With Ports Pi P2 and P3mentioning
confidence: 99%