Synchrotron-based radioscopy with spatio-temporal micro-resolution using hard X-rays

Abstract

The use of highly intense synchrotron light sources allows the next step in the fast imaging development: the use of hard X-rays. Micro-radiography as an established method to image the internal structure of an object with micrometer resolution can be extended to study its temporal evolution as well. While direct converting pixel detectors are known which can acquire images with high frame rates here detectors are needed with higher spatial resolution which can stand the highly intense synchrotron photon flux. Our approach is based on indirect pixel detectors which are already known for micro-imaging at synchrotron light sources. We combine those with eMOS cameras in order to achieve frame rates of up to 40000 images per second, thus progressing to micro-radioscopy. Potential applications are studies of living insects with moderate frame rates up to 250 images per second (4 ms exposure time), velocity fields within a semi-solid alloy during a thixo-casting process and ruptures of individual cell walls in a liquid metal foam imaged with up to 40000 frames per second (25 Jls exposure time).

X‐ray Tomography and Tomoscopy on Metals: A Review

“…[98,99] One can improve one by decreasing the other, similar to what is the case in fast X-ray radioscopy experiments. [98,100] Villanova et al, [101] Yashiro et al [102] and García-Moreno et al [3] as well as the Tomoscopy Experiments database [52] show that there is a limiting boundary for both. Figure 2 shows that there is a limit for temporal resolution, which has improved almost exponentially over the past years.…”

Materials tomography is coming of age

“…Griesche et al [6] demonstrate the need of further contrast modes by employing neutron imaging to understand the relation between cold cracking and hydrogen release in steels. On a more general level, the papers in this issue show that new contrast modes and enhanced time resolution can be expected to introduce imaging with neutrons or X-rays to new scientific communities in the near future, as outlined by Lehmann et al [7], Abbey et al [8] and Rack et al [9]. Even approaches which, at first glance, might be considered as very specific such as ptychography, coherent diffraction imaging or grain tracking by diffraction tomography are finding their way towards materials science applications, as depicted by Phillips et al [10] and Bormann et al [11].…”