2004
DOI: 10.1134/1.1649435
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Synchrotron investigations of the specific features in the electron energy spectrum of silicon nanostructures

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Cited by 12 publications
(7 citation statements)
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“…Comparing XANES spectra for the samples A and B one can observe a considerable difference in the range of absorption edge of elementary silicon. A typical absorption edge is observed in the sample B and it corresponds to disordered silicon and it is close to the spectrum of amorphous hydrogenated silicon a-Si:H [9]. On the other hand, in the spectrum of sample B one can see a strong decay that resembles the inversed dine structure of absorption edge for the crystalline silicon.…”
Section: Introductionmentioning
confidence: 66%
“…Comparing XANES spectra for the samples A and B one can observe a considerable difference in the range of absorption edge of elementary silicon. A typical absorption edge is observed in the sample B and it corresponds to disordered silicon and it is close to the spectrum of amorphous hydrogenated silicon a-Si:H [9]. On the other hand, in the spectrum of sample B one can see a strong decay that resembles the inversed dine structure of absorption edge for the crystalline silicon.…”
Section: Introductionmentioning
confidence: 66%
“…However, no one of them can explain all of the observed experimental facts. Previously we have found [6,7] that por-Si involves nanocrystalline forms of silicon, covered with amorphous and oxide phases, and their ratio can change with ageing time. In the work [7] we proposed a model of photoluminescence in por-Si as a result of electron transitions between the energy levels of crystalline and oxide phases.…”
mentioning
confidence: 99%
“…The same spectrum can be observed in a-Si slightly saturated with hydrogen thus meaning that amorphous hydrogenated silicon (a-Si:H) can be formed in the porous layer [19].…”
Section: Contributedmentioning
confidence: 51%
“…This property proves to be very useful for the study of the electron structure of the complicated multi-phase substances. Analysis of the X-ray spectra of the investigated samples of the investigated samples has been carried out by comparison with those ones of the reference compounds [17,19]. Let us consider Si L 2,3 emission spectra of porous layers presented in Fig.…”
mentioning
confidence: 99%
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