“…where ðdAE=dÞ silica is the absolute scattering cross section of silica, and I i , %T i and t i represent the scattering intensity, transmission and thickness of the i component, respectively. In addition, SAXS experiments were conducted at the SAXS beamlines (4C1 and 4C2) (Bolze et al, 2002;Lee et al, 2004Lee et al, , 2008Jang et al, 2006;Choi et al, 2007;Jin et al, 2007;Kim et al, 2007Kim et al, , 2008Jin, Park et al, 2008;Heo et al, 2007;Heo, Yoon, Jin, Kim et al, 2008;Heo, Yoon, Jin, Sato et al, 2008;Yoon et al, 2007;Yoon, Jung et al, 2008;Yoon, Kim et al, 2008) of Pohang Accelerator Laboratory (Ree & Ko, 2005) at Pohang University of Science and Technology in Korea. SAXS measurements were carried out at room temperature for a series of octene-mLLDPE(D)/ LDPE(H) blend samples by using a two-dimensional CCD detector (Princeton Instruments Inc., USA) consisting of 1152 Â 1242 pixels.…”