2022
DOI: 10.1109/ted.2022.3195473
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Synergetic Effect of Photoconductive Gain and Persistent Photocurrent in a High-Photoresponse Ga2O3Deep-Ultraviolet Photodetector

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Cited by 30 publications
(11 citation statements)
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“…The obtained values of α were 0.94 and 0.26 for the device under 254 and 365 nm light, respectively. The α values were both less than 1, which may be related to the high concentration of trapped states in the film, leading to strong carrier scattering and electron–hole recombination. , The characteristics of PDCR presented an increasing trend under two different UV illuminations. Moreover, the linear dynamic range (LDR) can verify the capability of detecting weak light, which can be expressed by the equation LDR = 20 .25em log ( I ph I normald ) Note that the device had a wide LDR above ∼96.8 dB under 254 nm light.…”
Section: Resultsmentioning
confidence: 94%
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“…The obtained values of α were 0.94 and 0.26 for the device under 254 and 365 nm light, respectively. The α values were both less than 1, which may be related to the high concentration of trapped states in the film, leading to strong carrier scattering and electron–hole recombination. , The characteristics of PDCR presented an increasing trend under two different UV illuminations. Moreover, the linear dynamic range (LDR) can verify the capability of detecting weak light, which can be expressed by the equation LDR = 20 .25em log ( I ph I normald ) Note that the device had a wide LDR above ∼96.8 dB under 254 nm light.…”
Section: Resultsmentioning
confidence: 94%
“…The α values were both less than 1, which may be related to the high concentration of trapped states in the film, leading to strong carrier scattering and electron−hole recombination. 44,45 The characteristics of PDCR presented an increasing trend under two different UV illuminations. Moreover, the linear dynamic range (LDR) can verify the capability of detecting weak light, which can be expressed by the equation 46…”
Section: Optoelectronic Performance Characterization Of Thementioning
confidence: 99%
“…Assuming that all of the incident photons with h ν are absorbed at the surface, G can be expressed as follows , G = N pge N photon = normalΔ Q / normale normalΔ E ph / h ν where N pge is the number of photogenerated carriers passing through the electrode, N photon is the number of photons exposed to the device, Δ Q is the number of charges passing through the electrode per unit time, and Δ E ph is the illumination energy absorbed by the semiconductor per unit time. By dividing the unit time, formula can also be expressed as follows G = normalΔ Q / normale normalΔ E ph / h ν = ( I ph I normald ) / normale italicSP / h ν …”
Section: Resultsmentioning
confidence: 99%
“…In order to characterize the DUV photoresponse in detail, photoresponsivity (R), detectivity (D * ), and external quantum efficiency (EQE) are introduced for specific characterization. They can be shown as [34] R =…”
Section: Resultsmentioning
confidence: 99%