2022
DOI: 10.3390/nano12030462
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Synergy of Electrostatic and Chemical Doping to Improve the Performance of Junctionless Carbon Nanotube Tunneling Field-Effect Transistors: Ultrascaling, Energy-Efficiency, and High Switching Performance

Abstract: The low on-current and direct source-to-drain tunneling (DSDT) issues are the main drawbacks in the ultrascaled tunneling field-effect transistors based on carbon nanotube and ribbons. In this article, the performance of nanoscale junctionless carbon nanotube tunneling field-effect transistors (JL CNTTFETs) is greatly improved by using the synergy of electrostatic and chemical doping engineering. The computational investigation is conducted via a quantum simulation approach, which solves self-consistently the … Show more

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Cited by 18 publications
(14 citation statements)
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“…In fact, the curves are drawn from the I DS -V GS characteristics by using a window having a length equal to V DD =V DS =0.3 V, where the right end denotes the oncurrent while the left end denotes the off-current. By shifting this V DD window while extracting the corresponding on-and off-state currents at each step, the curves are within reach [47][48][49]. In figure 8(a), we can see that for a shared value of I OFF , the FE-GNRFETs exhibit higher I ON and for a shared value of I ON the FE-GNRFETs provide lower I OFF , which hints at substantial improvement in terms of current ratio.…”
Section: Resultsmentioning
confidence: 87%
See 1 more Smart Citation
“…In fact, the curves are drawn from the I DS -V GS characteristics by using a window having a length equal to V DD =V DS =0.3 V, where the right end denotes the oncurrent while the left end denotes the off-current. By shifting this V DD window while extracting the corresponding on-and off-state currents at each step, the curves are within reach [47][48][49]. In figure 8(a), we can see that for a shared value of I OFF , the FE-GNRFETs exhibit higher I ON and for a shared value of I ON the FE-GNRFETs provide lower I OFF , which hints at substantial improvement in terms of current ratio.…”
Section: Resultsmentioning
confidence: 87%
“…Inspecting the same figure, we can see that the FE-GNRFET with T FE =6 nm exhibits sub-60 mV dec −1 at a given I DS range. In addition, we can observe that the I 60 factor, which is the highest drain current at which the SS=60 mV dec −1 is obtained (for FETs providing sub-thermionic SS) [46,47], is recorded at 4×10 -7 A. The recorded steep subthreshold behavior is normally attributed to the FE-induced amplified gate voltage shown in figure 4, which becomes significant with t FE increasing, for this reason a speed up in terms of I DS -V GS switching is pronounced.…”
Section: Resultsmentioning
confidence: 94%
“…In order to achieve reliable devices or test structures at nanoscale dimensions, it is necessary to control doping levels on silicon nanosheets and to reduce leakage power. In comparison to short-channel MOSFETs, engineering of gate work function [ 5 , 6 ], lateral channels [ 7 ], multiple gate geometry [ 8 ], homodielectric based SOI/SON FETs [ 9 ], negative capacitance transistor [ 10 , 11 ], and tunneling transistors [ 12 , 13 ] have demonstrated admirable performance. Due to the band-to-band tunneling (BTBT) mechanism, devices with steep slopes, such as Tunnel-FETs, have reduced leakage current and facilitate further scaling without degradation of performance.…”
Section: Introductionmentioning
confidence: 99%
“…However, for CNT, graphene, and the other 2D-material-based FETs, the chemical route of doping is quite cumbersome as these nanoscale devices demand the formation of very high doping gradient–based junctions [ 25 ]. Therefore, electrostatic doping, which potentially replaces the conventional donor/acceptor dopant–based chemical doping with image charge, i.e., free-electron/hole, has been adopted for nanoscale devices [ 26 , 27 , 28 ]. The difference in the photosensitive gate and CNT/GNR work function, applied voltage, energy bandgap, trap engineering, and their interactions result in an electrostatic connection that governs the carrier density for the formation of the p-channel in the proposed phototransistor.…”
Section: Introductionmentioning
confidence: 99%