2005
DOI: 10.1016/j.materresbull.2005.03.030
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Synthesis and characterization of boron–oxygen–hydrogen thin films at low temperatures

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Cited by 10 publications
(7 citation statements)
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“…This hypothesis is supported by the uniform distribution of impurity elements over the film thickness, as detected by ERDA. The incorporation of H from residual water has been reported during physical vapour deposition in a high vacuum ambient before [25][26][27]. To the best of our knowledge, direct synthesis of crystalline AlMgB 14 films and related compounds has not been reported so far.…”
Section: Resultsmentioning
confidence: 99%
“…This hypothesis is supported by the uniform distribution of impurity elements over the film thickness, as detected by ERDA. The incorporation of H from residual water has been reported during physical vapour deposition in a high vacuum ambient before [25][26][27]. To the best of our knowledge, direct synthesis of crystalline AlMgB 14 films and related compounds has not been reported so far.…”
Section: Resultsmentioning
confidence: 99%
“…As discussed in the introduction impurities such as C [29], H [35,36], N [37] and O [13,28,30,38,39] are often observed during thin film synthesis by PVD as well as during bulk synthesis. We have shown that O impurities affect the electronic structure, bonding as well as the density and hence the elastic properties of the here considered amorphous boron rich solids.…”
Section: Resultsmentioning
confidence: 99%
“…Synthesis of thin films in high vacuum often results in incorporation of impurities from residual gas constituents [13,[35][36][37] or target impurities [28][29][30]38], such as C [29], H [35,36], N [37] or O [13,28,30,[37][38][39]. Such impurities can affect the structure and/or properties of the thin films [30,35,36,40].…”
Section: Introductionmentioning
confidence: 99%
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“…This is consistent with the R D data analysis. Additionally, it is known that materials with a large affinity to residual gas form reaction products on the cathode surface38 as well as during alumina,39 strontium titanate,40 and boron suboxide41 growth.…”
Section: Resultsmentioning
confidence: 99%