This survey investigates the thermal evaporation of Ag2Se on glass substrates at
various thermalannealing temperatures (300, 348, 398, and 448) °K. To ascertain the
effect of annealingtemperature on the structural, surface morphology, and optical
properties of Ag2Se films,investigations and research were carried out. The crystal
structure of the film was described by
Xraydiffractionandothermethods.ThephysicalstructureandcharacteristicsoftheAg2Sethinfilms
wereexaminedusingX-rayandatomicforcemicroscopy(AFM)basedtechniques.TheAg2Se films
surface morphology was examined by AFM techniques; the investigation gave
averagediameter, surface roughness, and grain size mutation values with increasing
annealing temperature(75.74 nm–96.36 nm). Additionally, With various variations to the
nominal values, the absorbanceand transmittance spectra are further studied and reported
in accordance with the wavelength rangeof (400-1100) nm. The findings indicate that the
sample highest absorbance value was attained ata temperature treatment of 448 K, whereas
the sample highest transmittance was at a temperaturetreatment of 300 K. According to
the results, direct transitions were permitted in the under-reviewthin films at optical
energies of (2.15, 1.85, 1.75, and 1.7) eV, respectively